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Y. Zhang

Researcher at University of Electronic Science and Technology of China

Publications -  21
Citations -  535

Y. Zhang is an academic researcher from University of Electronic Science and Technology of China. The author has contributed to research in topics: Thin film & Epitaxy. The author has an hindex of 10, co-authored 21 publications receiving 395 citations.

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Ultrahigh-Responsivity, Rapid-Recovery, Solar-Blind Photodetector Based on Highly Nonstoichiometric Amorphous Gallium Oxide

TL;DR: In this article, amorphous gallium oxide thin films were deposited by radio frequency (RF) magnetron sputtering, and the metal-semiconductor-metal (MSM) PD was fabricated and compared with a β-Ga2O3 film prepared side-by-side as the control sample.
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Enhanced dielectric characteristics of preferential (1 1 1)-oriented BZT thin films by manganese doping

TL;DR: In this article, Mn-doped BZT thin films were deposited on Pt/Ti/SiO2/Si by the pulsed laser deposition (PLD) technique under the same growth conditions and X-ray diffraction scans showed that both films were polycrystalline and preferentially (1 1 1)-oriented.
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Epitaxial growth of the CoFe2O4 film on SrTiO3 and its characterization

TL;DR: The growth modes of CoFe 2 O 4 (CFO) thin film are found to be sensitive to laser repetition, the transitions from layer-by-layer mode to Stranski-Krastanov (SK) mode and then to island mode occur at the laser repetition of 3 and 5 Hz at 700 °C, respectively as discussed by the authors.
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Layer-controlled synthesis of wafer-scale MoSe 2 nanosheets for photodetector arrays

TL;DR: In this paper, a two-step synthesis method was adopted to produce wafer-scale molybdenum diselenide (MoSe2) nanosheets.
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Epitaxial growth of cubic AlN films on SrTiO3(1 0 0) substrates by pulsed laser deposition

TL;DR: The epitaxial relationship of cubic AlN film on SrTiO 3 substrate was AlN[1,0,0]∥SrTiO3 [1, 0, 0] and AlN(2,0,0)∥srTi2O 3 [1, 0, 0] as discussed by the authors, showing that the surface morphology of AlN films strongly depended on N 2 partial pressure.