We experimentally demonstrate a perfect plasmonic absorber at λ = 1.6 μm. Its polarization-independent absorbance is 99% at normal incidence and remains very high over a wide angular range of incidence around ±80°. We introduce a novel concept to utilize this perfect absorber as plasmonic sensor for refractive index sensing. This sensing strategy offers great potential to maintain the performance of localized surface plasmon sensors even in nonlaboratory environments due to its simple and robust measurement scheme.

Infrared Perfect Absorber and Its Application As Plasmonic Sensor

Photonic metamaterials are man-made structures composed of tailored micro- or nanostructured metallodielectric subwavelength building blocks. This deceptively simple yet powerful concept allows the realization of many new and unusual optical properties, such as magnetism at optical frequencies, negative refractive index, large positive refractive index, zero reflection through impedance matching, perfect absorption, giant circular dichroism and enhanced nonlinear optical properties. Possible applications of metamaterials include ultrahigh-resolution imaging systems, compact polarization optics and cloaking devices. This Review describes recent progress in the fabrication of three-dimensional metamaterial structures and discusses some of the remaining challenges.

Past achievements and future challenges in the development of three-dimensional photonic metamaterials

Resonant plasmonic and metamaterial structures allow for control of fundamental optical processes such as absorption, emission and refraction at the nanoscale. Considerable recent research has focused on energy absorption processes, and plasmonic nanostructures have been shown to enhance the performance of photovoltaic and thermophotovoltaic cells. Although reducing metallic losses is a widely sought goal in nanophotonics, the design of nanostructured 'black' super absorbers from materials comprising only lossless dielectric materials and highly reflective noble metals represents a new research direction. Here we demonstrate an ultrathin (260 nm) plasmonic super absorber consisting of a metal–insulator–metal stack with a nanostructured top silver film composed of crossed trapezoidal arrays. Our super absorber yields broadband and polarization-independent resonant light absorption over the entire visible spectrum (400–700 nm) with an average measured absorption of 0.71 and simulated absorption of 0.85. Proposed nanostructured absorbers open a path to realize ultrathin black metamaterials based on resonant absorption.

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Broadband polarization-independent resonant light absorption using ultrathin plasmonic super absorbers

The advent of negative index materials has spawned extensive research into metamaterials over the past decade. Metamaterials are attractive not only for their exotic electromagnetic properties, but also their promise for applications. A particular branch–the metamaterial perfect absorber (MPA)–has garnered interest due to the fact that it can achieve unity absorptivity of electromagnetic waves. Since its first experimental demonstration in 2008, the MPA has progressed significantly with designs shown across the electromagnetic spectrum, from microwave to optical. In this Progress Report we give an overview of the field and discuss a selection of examples and related applications. The ability of the MPA to exhibit extreme performance flexibility will be discussed and the theory underlying their operation and limitations will be established. Insight is given into what we can expect from this rapidly expanding field and future challenges will be addressed.

https://www.onlinelibrary.wiley.com/doi/pdf/10.1002/adma.201200674

Metamaterial Electromagnetic Wave Absorbers

Huygens' principle is a well-known concept in electromagnetics that dates back to 1690. Here, it is applied to develop designer surfaces that provide extreme control of electromagnetic wave fronts across electrically thin layers. These reflectionless surfaces, referred to as metamaterial Huygens' surfaces, provide new beam shaping, steering, and focusing capabilities. The metamaterial Huygens' surfaces are realized with two-dimensional arrays of polarizable particles that provide both electric and magnetic polarization currents to generate prescribed wave fronts. A straightforward design methodology is demonstrated and applied to develop a beam-refracting surface and a Gaussian-to-Bessel beam transformer. Metamaterial Huygens' surfaces could find a wide range of applications over the entire electromagnetic spectrum including single-surface lenses, polarization controlling devices, stealth technologies, and perfect absorbers.

Metamaterial Huygens' surfaces: tailoring wave fronts with reflectionless sheets.

A metamaterial-based approach in making a wide-angle absorber of infrared radiation is described. The technique is based on an anisotropic perfectly impedance-matched negative-index material PIMNIM .I t is shown analytically that a PIMNIM that is subwavelength in all three dimensions enables absorption close to 100% for incidence angles up to 45° to the normal. A specific implementation of such frequency-tunable PIMNIM based on plasmonic metamaterials is presented. Applications to infrared imaging and coherent thermal sources are described.

/pdf/wide-angle-infrared-absorber-based-on-a-negative-index-4exi4h2sod.pdf

Wide-angle infrared absorber based on a negative-index plasmonic metamaterial

The intensity of a subpicosecond laser pulse was amplified by a factor of up to 1000 using the Raman backscatter interaction in a 2 mm long gas jet plasma. The process of Raman amplification reached the nonlinear regime, with the intensity of the amplified pulse exceeding that of the pump pulse by more than an order of magnitude. Features unique to the nonlinear regime such as gain saturation, bandwidth broadening, and pulse shortening were observed. Simulation and theory are in qualitative agreement with the measurements.

/pdf/reaching-the-nonlinear-regime-of-raman-amplification-of-1xq5m2nymr.pdf

Reaching the Nonlinear Regime of Raman Amplification of Ultrashort Laser Pulses

Ultra-thin wide-angle perfect absorber for infrared frequencies

We have measured the dielectric properties and thickness of thin semiconductor epitaxy layers by the reflection of THz radiation from the surface of a two-layered semiconductor wafer When reflecting from two interfaces the electromagnetic pulse has a destructive interference at a specific wavelength dependent on the thickness of the outer layer and its dielectric function Near that frequency the reflection coefficient has a significant drop By extending the incident pulse spectrum to include this interference frequency, a measurement of the thickness can be obtained together with a direct measurement of the carrier number density By this technique epitaxy layers of thickness down to 15 μm are characterized

Characterization of the electrical properties and thickness of thin epitaxial semiconductor layers by THz reflection spectroscopy

Conventional adaptive-optics systems correct the wavefront by adjusting a deformable mirror (DM) based on measurements of the phase aberration taken in a pupil plane. The ability of this technique, known as phase conjugation, to correct aberrations is normally limited by the maximum spatial frequency of the DM. In this paper we show that conventional phase conjugation is not able to achieve the dark nulls needed for high-contrast imaging. Linear combinations of high frequencies in the aberration at the pupil plane "fold" and appear as low-frequency aberrations at the image plane. After describing the frequency-folding phenomenon, we present an alternative optimized solution for the shape of the deformable mirror based on the Fourier decomposition of the effective phase and amplitude aberrations.

Yoav Avitzour

Papers

Wide-angle infrared absorber based on a negative-index plasmonic metamaterial

Reaching the Nonlinear Regime of Raman Amplification of Ultrashort Laser Pulses

Ultra-thin wide-angle perfect absorber for infrared frequencies

Characterization of the electrical properties and thickness of thin epitaxial semiconductor layers by THz reflection spectroscopy

On representing and correcting wavefront errors in high-contrast imaging systems