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Zhongdong Qi

Researcher at Tsinghua University

Publications -  14
Citations -  144

Zhongdong Qi is an academic researcher from Tsinghua University. The author has contributed to research in topics: Equal-cost multi-path routing & Policy-based routing. The author has an hindex of 4, co-authored 10 publications receiving 113 citations. Previous affiliations of Zhongdong Qi include University of California, Riverside.

Papers
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Proceedings ArticleDOI

Accurate prediction of detailed routing congestion using supervised data learning

TL;DR: A framework using nonparametric regression technique in machine learning to construct routing congestion model can capture multiple factors and enables direct prediction of detailed routing congestion with high accuracy and significant reduction of design rule violations and detailed routing runtime can be achieved.
Proceedings ArticleDOI

An accurate detailed routing routability prediction model in placement

TL;DR: Using a well-trained model, most design rule violations after detailed routing can be foreseen in placement stage and the average prediction accuracy is comparable with other state-of-art routability estimation techniques.
Proceedings ArticleDOI

Learning-based occupancy behavior detection for smart buildings

TL;DR: A novel method to detect the occupancy behavior of a building through the temperature and/or possible heat source information, which can be used for energy reduction, security monitoring for emerging smart buildings and overfitting and under-fitting problems is proposed.
Proceedings ArticleDOI

VFGR: A very fast parallel global router with accurate congestion modeling

TL;DR: Experimental results show that VFGR can achieve comparable or better global routing solution quality with two start-of-the-art global routers in shorter runtime, and it is demonstrated that adopting proposed congestion model in global routing, higher solution quality and much shorter runtime can be achieved in detailed routing stage.
Proceedings ArticleDOI

Physics-based full-chip TDDB assessment for BEOL interconnects

TL;DR: Experimental results obtained on a test chip show that upon the calibration the proposed flow provides a capability to evaluate chip-scale low-k TDDB reliability based on the calculated time-to-failure (TTF) and detect most leaking shapes in the layout.