Microscopy Microanalysis Microstructures 

About: Microscopy Microanalysis Microstructures is an academic journal. The journal publishes majorly in the area(s): Transmission electron microscopy & Electron diffraction. It has an ISSN identifier of 1154-2799. Over the lifetime, 393 publications have been published receiving 4377 citations.

Microscope imaging by time-of-flight secondary ion mass spectrometry

Abstract: The concept of Secondary Ion Microscopy, introduced by Castaing et al. [1], is applied to a direct imaging time-of-flight (TOF) mass spectrometer. The ion optical configuration for a particular [2] stigmatic imaging TOF mass spectrometer is reviewed. A number of fundamental factors influencing the mass resolution in any TOF spectrometer are discussed. The question of where microscope imaging offers advantages over microprobe imaging in TOF Secondary Ion Mass Spectrometry

Design and first applications of a post-column imaging filter

Abstract: We have designed and built an imaging filter which can be attached to most standard TEMs, and is capable of operating at primary energies of up to 400 keV. The filter uses a 90° magnetic sector prism, a piezoelectrically controlled energy-selecting slit, and 6 quadrupole and 5 sextupole lenses. It fully corrects second-order aberrations and distortions in images formed with electrons of selected energies, and it also produces second-order aberration-corrected spectra of variable dispersion. We show the first applications of the filter at 200 keV primary energy, which indicate that the filter will excel in chemical mapping and spectroscopy, in improving contrast of electron images and diffraction patterns, and in making high resolution electron microscopy and diffraction more quantitative. We conclude the paper with a discussion about atomic resolution image formation using inelastically scattered electrons, and the relationship between energy-filtered diffraction patterns and images formed with electrons of the same energy.

Analysis of Variations in Structure from High Resolution Electron Microscope Images by Combining Real Space and Fourier Space Information

Abstract: A new method is described for analysing variations in structure from high resolution electron microscope images. In Fourier theory, the image of a perfect crystal can be considered as the sum of sinusoidal lattice fringes having constant amplitude and phase given by the corresponding Fourier component. Imperfections are introduced by allowing these Fourier components to be a function of position, thus combining real space and reciprocal space information. It is shown how images can be obtained of the local value of the amplitude and phase of each major image periodicity. The amplitude and phase images are interpreted in terms of image detail and structural variations. Relationships are derived between the phase images and displacement fields due to a distortion of the lattice fringes and variations in the local reciprocal lattice vector. The meaning of the amplitude and phase images is illustrated by the analysis of experimental images of antiphase boundaries. Quantitative analysis of experimental images of carbon nanotubes is carried out using amplitude images and of strained metal multilayers using phase images.