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Journal ArticleDOI

Cumulative quantity control charts for monitoring production processes

L. Y. Chan, +2 more
- 01 Jan 2000 - 
- Vol. 38, Iss: 2, pp 397-408
TLDR
In this article, the cumulative quantity control chart (CQC-chart) is introduced for monitoring high-yield processes with low defect rates, which can be used no matter whether the process defect rate is low or not.
Abstract
Two commonly used statistical quality control charts, the c-chart and u-chart, are unsatisfactory for monitoring high-yield processes with low defect rates. To overcome this difficulty, a new type of control chart called the cumulative quantity control chart (CQC-chart) is introduced in this paper. The CQC-chart can be used no matter whether the process defect rate is low or not, and when the process defect rate is low or moderate the CQC-chart does not have the shortcoming of the c- and u-charts of showing up false alarm signals too frequently. The CQC-chart does not require rational subgrouping of samples (which is necessary for the c- and u-charts), and is appropriate for monitoring automated manufacturing processes.

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Citations
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Some effective control chart procedures for reliability monitoring

TL;DR: A recent control scheme based on the cumulative quantity between observations of defects has been proposed which can be easily adopted to monitor the failure process for exponentially distributed inter-failure time and can detect process improvement even in a high-reliability environment.
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Designing production systems for quality: Research opportunities from an automotive industry perspective

TL;DR: In this article, the authors explore the intersection of two research areas: quality and production system design, and argue that the production system used to manufacture a product does indeed affect its quality.
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Control Charts Based on the Exponential Distribution: Adapting Runs Rules for the t Chart

TL;DR: In this article, a probabilistic-based method to construct a t chart to monitor the stability of a process is presented, assuming that the time between events can be modeled with an exponential distribution, and applying the supplementary runs rules to identify whether the process is out of control.
Journal ArticleDOI

A control chart for the Gamma distribution as a model of time between events

TL;DR: In this article, a random-shift model for calculating the out-of-control average time to signal (ATS) of the Gamma chart is developed, which is shown to be much more accurate than the conventional method based on a fixed shift model through comparing with Monte Carlo simulation.
Journal ArticleDOI

An Overview of Control Charts for High‐quality Processes

TL;DR: Time-between-events control charts detect an out-of-control situation without great loss of sensitivity as compared with existing charts, and draw a precise conclusion from the statistical point of view.
References
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Journal ArticleDOI

Quality Control Techniques for "Zero Defects"

TL;DR: In this paper, the authors propose to use a control chart that plots the number of good items between defects on a logarithmic scale to accommodate large numbers, establishing upper and lower limits on the number between defects.
Journal ArticleDOI

A Control Chart for Parts-Per-Million Nonconforming Items

TL;DR: A control chart for parts-per-million nonconforming items is presented in this article, with a focus on parts per-million nonconformity in parts per million items.
Book

Advanced Topics in Statistical Process Control: The Power of Shewhart's Charts

TL;DR: The Power of Shewhart's Charts as discussed by the authors is a seminal work in statistical process control that describes the power of Shehart's charts and its application in statistical processes.
Journal ArticleDOI

Some procedures for decision making in controlling high yield processes

TL;DR: In this paper, a decision graph is introduced with which we can easily judge whether the process is out of control when a non-conforming item is observed after a number of conforming ones, accompanied by the certainty level of this judgement.
Journal ArticleDOI

Control Schemes for Low Count Levels

TL;DR: The count of counts which occur at very low levels is discussed in this article, where very low count levels can be below the range of counts covered in a previous article on Counted Data CUSUMS.