Journal ArticleDOI
Empirical formula for the calculation of secondary ion yields from oxidized metal surfaces and metal oxides
TLDR
In this article, the absolute yields of the secondary ions MeO ± n (n = 0, 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 28, 30, 31, 34, 35, 34) were derived from 15 oxidized metal surfaces in a UHV mass spectrometer.About:
This article is published in Surface Science.The article was published on 1977-10-02. It has received 133 citations till now. The article focuses on the topics: Metal K-edge & Static secondary-ion mass spectrometry.read more
Citations
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Chemical Analysis of Inorganic and Organic Surfaces and Thin Films by Static Time‐of‐Flight Secondary Ion Mass Spectrometry (TOF‐SIMS)
TL;DR: The Static Time-of-flight Secondary Ion Mass Spectrometer (TOF-SIMS) as discussed by the authors allows monolayer imaging and local analysis of monolayers with high sensitivity, a wide mass range, high mass resolution, and high lateral resolution.
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Interactions of CO2 and CO at fractional atmosphere pressures with iron and iron oxide surfaces: one possible mechanism for surface contamination?
TL;DR: In this article, the interactions of carbon dioxide and carbon monoxide at moderately high pressures with clean iron surfaces have been studied using x-ray photoelectron spectroscopy (XPS) and static time-of-flight secondary ion mass spectrometry (ToF-SIMS).
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Static secondary ion mass spectrometry (S-SIMS) Part 1: methodology and structural interpretation
TL;DR: Static secondary ion mass spectrometry (S-SIMS) as discussed by the authors allows the chemical characterization of the constituents in the upper monomolecular layer of a solid sample within the range of micro-analytical methods.
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Experimental and theoretical approaches to the ionization process in secondary-ion emission
G. Blaise,A. Nourtier +1 more
TL;DR: The role of foreign atoms (host atoms in alloys, associated species in covalent and ionic compounds, surface contaminants such as oxygen and caesium) is not fully understood owing to the complex influence of the environment, and its description is at present limited mainly to some empirical rules of relative validity as discussed by the authors.
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Surface analysis by Secondary Ion Mass Spectrometry (SIMS)
TL;DR: Static secondary ion mass spectrometry (static SIMS) as discussed by the authors provides detailed information on the atomic and molecular composition of the uppermost monolayer of a solid by mass analysis of sputtered secondary ions emitted from this layer during keV primary ion bombardment.
References
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Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)
TL;DR: In this article, secondary ion mass spectroscopy (SIMS) was used to investigate the chemical composition of the uppermost monomolecular layer of the bombarded surface.
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Thermodynamic approach to the quantitative interpretation of sputtered ion mass spectra
C.A. Andersen,J.R. Hinthorne +1 more
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A quantum-mechanical model for the ionization and excitation of atoms during sputtering
TL;DR: In this paper, a quantum-mechanical model for the process by which an atom is excited or ionized as it is sputtered from a metal surface was developed, where the probability of excitation was given by R = (A/ΔE)2(hv/aΔ E)n, where A is the binding energy of a surface atom before sputtering, v is its average velocity after sputtering and Δ E the excitation energy.
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Progress in analytic methods for the ion microprobe mass analyzer
TL;DR: In this paper, the ion microprobe mass analyzer accomplishes the chemical analysis of a microvolume of a solid sample by sputtering ions from its surface with a high-energy beam of bombarding ions.
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Beobachtung von oberflächenreaktionen mit der statischen methode der sekundärionen-massenspektroskopie. I die methode
TL;DR: The statical method of secondary ion mass spectroscopy (SIMS) as discussed by the authors is a powerful tool for the analysis of chemical reactions at the surface of a solid. And it can be used to detect the initial surface oxidation of metals.