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Patent

Flip-flop circuit

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TLDR
In this article, the problem of providing a flip-flop circuit which is not affected by delay in normal operation without being increased in circuit scale when a test is conducted in a through state is addressed.
Abstract
PROBLEM TO BE SOLVED: To provide a flip-flop circuit which is not affected by delay in normal operation without being increased in circuit scale when a test is conducted in a through state SOLUTION: A signal which is in phase with a clock signal C and its inverted signal CB are supplied to the transfer gates (12, 13) of a slave latch A signal MC which is outputted by a control circuit 10 composed of a NAND circuit, receiving the clock signal C and a control signal T, and its inverted signal MCB are used as signals for controlling the transfer gates of a master latch so as to put the master circuit in a through state at the time of a test with the control signal

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