High-resolution spherical-aberration-free phase imaging by defocus image modulation processing under hollow-cone illumination : Experimental confirmation by optical microscopy

TLDR: In this paper, a new type high resolution electron microscopic observation, DIMP-EM under hollow-cone illumination, has been presented, where the spherical-aberration-free complex wavefield at the exit surface of the specimen has been retrieved with the resolution 1.8 times higher than under axial illumination.

About: This article is published in Optik.The article was published on 1997-01-01 and is currently open access. It has received 1 citations till now. The article focuses on the topics: Resolution (electron density) & Spherical aberration.