Journal ArticleDOI
High-resolution imaging with an aberration-corrected transmission electron microscope.
TLDR
Recently an electromagnetic hexapole system for the correction of the spherical aberration of the objective lens of a 200 kV transmission electron microscope has been constructed and new imaging modes are available, which can extend the point resolution of phase-contrast imaging to the information limit.About:
This article is published in Ultramicroscopy.The article was published on 2002-08-01. It has received 204 citations till now. The article focuses on the topics: Contrast transfer function & Spherical aberration.read more
Citations
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Journal ArticleDOI
Direct Imaging of Lattice Atoms and Topological Defects in Graphene Membranes
Jannik C. Meyer,Christian Kisielowski,Rolf Erni,Marta D. Rossell,Michael F. Crommie,Alex Zettl +5 more
TL;DR: Multiple five- and seven-membered rings appear exclusively in combinations that avoid dislocations and disclinations, in contrast to previous observations on highly curved (tube- or fullerene-like) graphene surfaces.
Journal ArticleDOI
Atomic-resolution imaging of oxygen in perovskite ceramics.
TL;DR: Using an imaging mode based on the adjustment of a negative value of the spherical-aberration coefficient of the objective lens of a transmission electron microscope, all types of atomic columns in the dielectric SrTiO3 and the superconductor YBa2Cu3O7 are imaged.
Journal ArticleDOI
From graphene constrictions to single carbon chains
TL;DR: In this article, an atomic-resolution observation and analysis of graphene constrictions and ribbons with sub-nanometer width was performed by imaging side spherical aberration-corrected transmission electron microscopy at 80?kV.
Journal ArticleDOI
Atomic-resolution measurement of oxygen concentration in oxide materials.
Chun-Lin Jia,Knut Urban +1 more
TL;DR: The modified Ti2O9 group unit thus formed reduces the grain boundary energy and provides a way of accommodating oxygen vacancies occurring in oxygen-deficient material by the formation of a nanotwin lamellae structure.
Journal ArticleDOI
High-Resolution Transmission Electron Microscopy Using Negative Spherical Aberration
TL;DR: The application of a novel imaging mode based on the adjustment of a negative value of the spherical aberration CS of the objective lens of a transmission electron microscope equipped with a multipole aberration corrector system to the imaging of oxygen in SrTiO3 and YBa2Cu3O7 demonstrates the benefit to materials science investigations.
References
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Journal ArticleDOI
Electron microscopy image enhanced
TL;DR: In this paper, the authors report a solution to this problem for a medium-voltage electron microscope which gives a stunning enhancement of image quality, which can be used to improve the resolution of the electron microscope.
Journal ArticleDOI
The Theoretical Resolution Limit of the Electron Microscope
TL;DR: The resolving power of the electron microscope and the contrast in the image are calculated for different conditions of focusing, illumination and aperture as mentioned in this paper, which can change the limit of resolution by a factor of about 3.
Journal ArticleDOI
A spherical-aberration-corrected 200 kV transmission electron microscope
TL;DR: In this paper, a hexapole corrector system was constructed for compensation of the spherical aberration of the objective lens of a transmission electron microscope, and an improvement of the point resolution from 0.24nm to better than 0.14nm was realized.
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Coma-free alignment of high-resolution electron microscopes with the aid of optical diffractograms
TL;DR: In this paper, a transmission electron microscope with a single field condenser objective is used to align the microscope onto the coma-free and dispersion-free pencil axis and does not rely on current commutation.