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Journal ArticleDOI

Justification of the Model for Electron Interference Produced by an Electrostatic Biprism

J. Komrska, +1 more
- 01 Mar 1973 - 
- Vol. 20, Iss: 3, pp 207-215
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TLDR
In this paper, the wave function describing the electron interference produced by an electrostatic biprism derived from the perturbation theory involves an integral which is not easy to evaluate numerically.
Abstract
The wave function describing the electron interference produced by an electrostatic biprism derived from the perturbation theory involves an integral which is not easy to evaluate numerically. Using the method of stationary phase it is shown in the paper that the expression of this integral in terms of the Fresnel integrals considerably facilitates the calculations. Physically this expression corresponds to the superposition of two waves emerging from two virtual images of the source diffracted by two opaque half-planes of opposite orientation. In such a way the model widely used for discussions of the interference of this type is justified.

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Citations
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Journal ArticleDOI

Electron interferometry and interference electron microscopy

TL;DR: A state-of-the-art review of electron interferometry and interference electron microscopy is given in this article, with particular reference to off-axis electron holography.
Journal ArticleDOI

Progress in electron- and ion-interferometry

TL;DR: In this paper, a review of electron interferometric experiments which complement the field of electron holography is presented, focusing on less popular electron interfrogation experiments which have become fields of their own.
Book ChapterDOI

Electron Holography of Long-Range Electrostatic Fields

TL;DR: In this article, a discussion on electron holography of long-range electrostatic fields is presented, where the basic principles of holographic recording and processing, with the modifications introduced by the longrange behavior of a particular class of electric fields, namely, the perturbation of the reference wave.
Journal ArticleDOI

Interferometric methods for mapping static electric and magnetic fields

TL;DR: In this article, the authors provide a brief overview of the main ideas and methods behind field mapping, focusing on theoretical models that form the basis of the quantitative interpretation of electron holographic data.
Journal ArticleDOI

Electron-optical analysis of the electrostatic Aharonov-Bohm effect

TL;DR: In this article, the dependence of the electrostatic field distribution due to the contact potential difference in a bimetallic wire with no net charge was investigated by means of diffraction and interference experiments carried out in a transmission electron microscope.
References
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Book

Advances in Electronics and Electron Physics

L. Marton, +1 more
TL;DR: In this paper, the authors describe the use of the Kerre basis algorithm in mathematical morphology, R. Jones and I.D. Svalbe mirror-bank energy analyzers, S.P. Cahay and S.A. Bandyopadhyay fuzzy relations and applications, B. de Baets and E.S.
Journal ArticleDOI

Beobachtungen und Messungen an Biprisma-Interferenzen mit Elektronenwellen

TL;DR: In this article, an elektronenoptische Biprisma besteht aus einem metallissierten 2 μ-Quarzfaden and zwei geerdeten Elektroden.
Journal ArticleDOI

Intensity Distributions in Electron Interference Phenomena Produced by an Electrostatic Bi-prism

TL;DR: In this article, a model of electron interference obtained using an electrostatic bi-prism is described, in which two diffracted waves, each representing the diffraction of electrons emerging from a single source by an opaque half-plane, are superposed in such a way that the half-planes are of opposite orientation and overlap by a distance equal to the width of the Bi-Prism filament.
Journal ArticleDOI

The Source Width and Its Influence on Interference Phenomena in a Fresnel Electron Bi-prism

TL;DR: In this article, the dependence of interference fringes contrast in a Fresnel electron bi-prism on source width or virtual sources distance was investigated for different source widths and conditions.
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