Journal ArticleDOI
Measurement of optical phase difference using a polarization technique
TLDR
In this article, a method of measuring optical phase differences caused by the presence of optical path differences between two coherent light beams is reported, where a polarization technique is used and the phase differences are detected as rotation angles of the plane of polarization.Abstract:
A method of measuring optical phase differences caused by the presence of optical path differences between two coherent light beams is reported. A polarization technique is used and the phase differences are detected as rotation angles of the plane of polarization. The sensitivity of the method is better than 10 -4 λ and the stability is 3 X 10 -4 λ per minute. These limitations result from thermal fluctuations of the order of 10 -3 °C. A higher sensitivity of about 10 -5 λ, or better, is expected if the effect due to thermal fluctuations can be reduced.read more
Citations
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Patent
Laser heterodyne surface profiler
TL;DR: In this article, the deviation of the face of an object from a flat smooth surface using a laser beam having two plane-polarized components, one of a frequency greater than the other to produce a difference frequency with a phase to be used as a reference.
Patent
Polarization rotation compensator and optical isolator using the same
TL;DR: In this article, a polarization rotation compensator and an optical isolator using the same mechanism are described, where the latter is composed of a combination of a half-wave plate whose principal axis is inclined at an angle of θ/2 with respect to the plane of polarization of the incident light and a quarterwave plate, and a Faraday rotator and a second birefringent wedge plate, arranged in order of propagation of the backward light or of the forward light.
Patent
Photomask inspecting method and apparatus
TL;DR: In this article, a photomask is inspected on the basis of the difference between the polarized state of elliptical light produced upon superposition of two linearly polarized light beams having orthogonal polarization directions and passing through two different optical paths.
Patent
Elliptical light measuring method
TL;DR: In this article, a photomask is inspected on the basis of the difference between the polarized state of elliptical light produced upon superposition of two linearly polarized light beams having orthogonal polarization directions and passing through two different optical paths.
Journal ArticleDOI
Refractometric detector for a microcolumn high-performance size-exclusion and micro gel chromatograph
TL;DR: In this article, an interference-polarizing refractometric detector was developed for microcolumn size-exclusion chromatography (MSEC) columns with inner diameters of 0.2 to 0.5 mm and a detection limit of 8 × 10−8 refractive index units.
References
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Journal ArticleDOI
The Dispersion of Standard Air
TL;DR: By combining Barrell and Sears' measurements in the visible and Koch's and Traub's in the ultraviolet, a dispersion formula for standard air has been derived, viz., (n−1)108=6432.8+2 949 810(146−σ2)−1+25 540(41−σ 2)− 1,σ being vacuum wave number in μ−1, which should satisfy all needs of precision spectroscopy, in particular for converting wavelengths in air into vacuum values.
Journal ArticleDOI
Methods in High Precision Refractometry of Optical Glasses
TL;DR: Five refractive methods and an interferometric method for measuring refractive indices of optical glasses to a precision of several units in the sixth or seventh decimal place are examined.
Journal ArticleDOI
New High-Precision Photoelectric Universal Polarimeter and Birefringence Compensator*
TL;DR: In this article, a null-type photoelectric universal polarimeter (or ellipsometer) utilizing Faraday cells and a quarter-wave plate was evaluated and its precision was obtained with a precision of 10 seconds and the circularity to within 20 seconds of arc.
Journal ArticleDOI
A Quarter-Wave Compensator with a Sensitive Half-Shadow Device
TL;DR: In this paper, an accurate quarter-wave plate (Senarmont compensator) for the wavelength used (5461A) and a Nakamura half-shadow device were used to measure large and small optical phase differences between the components of an elliptically polarized radiation.