Journal ArticleDOI
The Physical Nature of the Electrical Breakdown of Solid Dielectrics
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This article is published in Transactions of The American Institute of Electrical Engineers.The article was published on 1922-01-01. It has received 51 citations till now. The article focuses on the topics: Electrical treeing & Partial discharge.read more
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Journal ArticleDOI
Dielectric Breakdown Process of Polymers
TL;DR: In this paper, the breakdown process of polymers is discussed from the standpoint of the inherent properties such as chemical structure, structural irregularities, the presence of additives, molecular motion, and so on.
Journal ArticleDOI
The maximum dielectric strength of thin silicon oxide films
TL;DR: In this article, the authors investigated thin film silicon oxide capacitors with nonshorting breakdowns and derived an expression for the maximum voltage V m. Calculated results for fields up to 9.5 MV/cm were found to agree well with measurements for temperatures from -145°C to 65°C and for thicknesses from 3000 A to 50 000 A.
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Space Charge Modulated Electrical Breakdown
TL;DR: It is concluded that dc breakdown initializing in the bulk whereas ac breakdown initializes in the vicinity of the sample-electrode interface, which is modulated by the electric field distortion induced by space charge.
Journal ArticleDOI
High-Performance Nonvolatile Organic Transistor Memory Devices Using the Electrets of Semiconducting Blends
TL;DR: It is suggested that the energy level and charge transfer in the blend electret had a significant effect on tuning the characteristics of nonvolatile transistor memory devices.
Journal ArticleDOI
Energy-storage pulsed-power capacitor technology
J.R. Laghari,W.J. Sarjeant +1 more
TL;DR: In this article, the authors delineated failure processes in highly stressed compact capacitors and discussed factors affecting the complex aging processes such as thermal, electromechanical, and partial discharges.