Does having Laue oscillation on XRD indicated better crystalline quality?
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Laue oscillations in XRD can indicate a high quality, crystallographically aligned film of the targeted compound . Laue XRD is a powerful probe to characterize microstructural changes in materials . Energy-dispersive X-ray Laue diffraction (EDLD) using a pnCCD detector coupled to a CsI(Tl) scintillator allows accurate and fast determination of lattice parameters and structure factors . X-ray Laue diffraction techniques can be used to study the structural perfection of patterned wafers . Laue experiments using synchrotron radiation have been carried out on quasicrystalline samples, providing information about the real structure and crystal quality . Therefore, the presence of Laue oscillations in XRD can indicate better crystalline quality, but it is important to consider the specific context and techniques used in each study.
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| Papers (5) | Insight |
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4 Citations | Yes, the presence of Laue oscillations in an XRD pattern indicates a high-quality, crystallographically aligned film of the targeted compound. |
2 Citations | The paper does not mention anything about Laue oscillation on XRD or its relationship to crystalline quality. |
01 Jan 2019 3 Citations | The provided paper does not directly address the question of whether having Laue oscillation on XRD indicates better crystalline quality. |
6 Citations | The paper does not directly address the question of whether having Laue oscillation on XRD indicates better crystalline quality. |
| The provided paper does not mention anything about Laue oscillation or its relationship to crystalline quality. |
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