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What are the factors that affect the IDSS of a MOSFET? 


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The factors that affect the IDSS of a MOSFET include the gate-voltage-dependent mobility, the accuracy of switching characterization, unclamped inductive switching (UIS) and diode recovery stress (DRS) failure modes, and the gate tunneling current. The gate-voltage-dependent mobility has a large effect on the (I ds, V g) characteristic but only a small effect on the thermal noise parameter α sat = R n g max . The accuracy of switching characterization is influenced by factors such as the signal zero bias of drain-source voltage and current, time delay between Vds and Ids, and sampling frequency and bandwidth . UIS and DRS failure modes are affected by stored minority carrier charge in the MOSFET source-drain diode . The gate tunneling current is impacted by energy quantization, gate leakage, and channel length-modulation and drain-induced barrier lowering effects . The subthreshold swing of a MOSFET can decrease as gate length is reduced before increasing catastrophically due to punchthrough current .

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The provided paper does not mention the factor that affects the IDSS (drain-to-source current at zero gate voltage) of a MOSFET. The paper discusses gate tunneling current, transconductance, and output conductance, but does not specifically mention IDSS.
The provided paper does not mention the factors that affect the IDSS (drain-to-source current at zero gate voltage) of a MOSFET.
The provided paper does not mention anything about the IDSS of a MOSFET.
The provided paper does not mention the factors that affect the IDSS of a MOSFET. The paper focuses on the gate-voltage-dependent mobility and its effect on thermal noise in MOSFETs.
Proceedings ArticleDOI
J.P. Phipps, K. Gauen 
01 Feb 1988
12 Citations
The provided paper does not mention the factors that affect the IDSS of a MOSFET.

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