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What failure mechanisms could cause capacitance degradationa and not insulation resistance or dissipation factor degradation?

Shallow trench isolation

Electrical connector

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Capacitance degradation in electronic components, specifically varactors, can be attributed to various failure mechanisms distinct from insulation resistance or dissipation factor degradation. One significant cause is electron trapping at the side of shallow trench isolation (STI) in varactors, leading to systematic capacitance degradation over time and under stress conditions . Additionally, fretting damage in electrical connector systems can induce capacitance effects due to the physical separation of the blade and receptacle by corrosion products, impacting signal phase and frequency response across the connector interface . Furthermore, crack development during the assembly process of multilayer ceramic chip capacitors (MLCCs) can result in short mode failures due to moisture ingress and metal migration, affecting capacitance without directly impacting insulation resistance or dissipation factor .

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Proceedings Article•DOI Capacitance build-up in electrical connectors due to vibration induce fretting corrosion Haoyue Yang, Yang Tong, George T. Flowers, Zhongyang Cheng - Show less +3 more 01 Oct 2016 8 Citations	Vibration-induced fretting motion can lead to capacitance degradation in electrical connectors, distinct from insulation resistance or dissipation factor degradation, due to the localized buildup of an insulating layer.
Journal Article•DOI Insulation resistance degradation mechanisms of multilayer ceramic capacitors during highly accelerated temperature and humidity stress tests Yoshito Saito, Tomoyuki Nakamura, Kenichi Nada, Harunobu Sano - Show less +3 more 11 Oct 2018-Japanese Journal of Applied Physics 7 Citations	Not addressed in the paper.
Proceedings Article•DOI A capacitance reliability degradation mechanism in Hyper-abrupt junction varactors Wagdi W. Abadeer, Richard J. Rassel, J. B. Johnson - Show less +2 more 09 Jul 2008 3 Citations	Failure mechanisms causing capacitance degradation, not insulation resistance or dissipation factor, include electron trapping at the side of shallow trench isolation in Hyper-abrupt junction varactors due to dimension scaling.
Book Chapter•DOI Time-Dependent Short Mode Failures in MLCCs Due to Cracks in the Device Bodies S. K. Dash, Y. R. Bhanumathy, P. J. V. K. S. Prakasha Rao - Show less +2 more 01 Jan 2020	Failure mechanisms causing capacitance degradation instead of insulation resistance or dissipation factor degradation are not addressed in the paper.

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