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In this paper, it is also shown that XPS is well-suited to provide quant.
This article is the first in a series of guides assembled by a committee of experienced XPS practitioners that are intended to assist inexperienced users by providing information about good practices in the use of XPS.
Journal ArticleDOI
Gui Yu, F.W. Zhu, Chunlin Chai 
01 Jan 2003-Applied Physics A
15 Citations
XPS is shown to be a powerful tool for characterizing magnetic films.
This characteristic is useful to obtain XPS spectra excited by the high energy X-ray, which reveals the deeper layers.
On the one hand, the great promise which XPS held out to catalytic chemists is now being realised.
The results show that the above issues, which are relevant to differing degrees in most XPS analyses, present significant challenges to highly accurate XPS quantification.
It is concluded that existing standardization is delivering good practices in the use of XPS and has a high potential to avoid the recently observed erroneous use, misapplications, and misinterpretation by new and inexperienced users of the method—which seems to be the main reason for the “reproducibility crisis” in the field of XPS applications.