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Our results suggest several new assignments for the XPS spectra.
The present article confirms the preliminary results obtained by XPS.
This article is the first in a series of guides assembled by a committee of experienced XPS practitioners that are intended to assist inexperienced users by providing information about good practices in the use of XPS.
XPS is shown to be a powerful tool in characterizing the materials sets that comprise SDT devices.
On the one hand, the great promise which XPS held out to catalytic chemists is now being realised.
These results indicate that utilizing full XPS data is more effective for improving the model prediction performance.
It is concluded that existing standardization is delivering good practices in the use of XPS and has a high potential to avoid the recently observed erroneous use, misapplications, and misinterpretation by new and inexperienced users of the method—which seems to be the main reason for the “reproducibility crisis” in the field of XPS applications.