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Showing papers on "Electronic packaging published in 1978"


Proceedings ArticleDOI
Ronald W. Gedney1
01 Apr 1978
TL;DR: In this article, the authors describe the module package currently in production at IBM-Endicott, New York and the advantages it provides in Large Scale Integration (LSI) packaging.
Abstract: Some obvious trends in electronic technology today are the movement of packaging (i.e., the interconnection of circuit elements) into the semiconductor technology and both cost and reliability are benefiting from this move. Figure 1 shows the relative cost of making an interconnection at the various levels of circuit packaging. Figure 2 shows the relative reliability of those interconnections. Given these trends, the future emphasis in electronic technology development will be on increasing levels of semiconductor integration and increasing packaging density at the first or module level. I would like to briefly describe the module package currently in production at IBM-Endicott, New York and the advantages it provides in Large Scale Integration (LSI) packaging.

20 citations


01 Oct 1978

9 citations



Journal ArticleDOI
TL;DR: The HEAO-B program forced the usual constraints upon the spacecraft experiment electronics: high reliability, low power consumption, and tight packaging at reasonable cost as discussed by the authors, and the programmable high voltage power supplies were unique in both application and simplicity of manufacture.
Abstract: The HEAO-B program forced the usual constraints upon the spacecraft experiment electronics: high reliability, low power consumption, and tight packaging at reasonable cost. The programmable high voltage power supplies were unique in both application and simplicity of manufacture. The hybridized measurement chain is a modification of that used on the SAS-C program; the charge amplifier design in particular shows definite improvement in performance over previous work.

5 citations


Proceedings ArticleDOI
L. K. Anderson1
01 Apr 1978
TL;DR: In this article, high-speed, densely-packed LSI chips pose some new packaging reliability challenges, and these are explored briefly. But the focus of integrated circuit packaging from low cost to high electrical and thermal performance and improved reliability is not discussed.
Abstract: Increasing scale of integration has tended to change the focus of integrated circuit packaging from low cost to high electrical and thermal performance and improved reliability. Today's high-speed, densely-packed LSI chips pose some new packaging reliability challenges. These are explored briefly.

3 citations