Showing papers on "Infrared spectroscopy correlation table published in 1993"

Method of acid value determination by infrared absorption

Abstract: A method of determining acid value with high accuracy, using an infrared spectrometer is provided, in which the absorbance is determined attributable to carboxylic group based on an infrared absorption spectrum at wave numbers around 3300 cm -1 .

In situ infrared spectroscopy of the electrode-electrolyte interface

Abstract: In the study of electrochemical processes, it is important to have a means for characterizing the molecular and ionic species at the electrode-electrolyte interface. Various types of optical vibrational spectroscopy are being used to do this in situ. Of these, Fourier transform infrared reflection absorption spectroscopy (IRRAS) has seen rapid progress and is in wide use. A review of the techniques used in our laboratory and examples of recent measurements are presented. The adsorbed species discussed are CO, CN-, SO42-, and HSO4- and the electrodes are, in most cases, polycrystalline noble metals. It is shown how the interpretation of the infrared spectra is greatly aided by comparison with ab initio molecular orbital computations of ions and molecules on metal clusters. Some of the difficulties in the interpretation of the infrared spectra are illustrated, and the future development of optical vibrational spectroscopy for studying electrode-electrolyte interfaces is discussed.

Method of infrared analysis

Abstract: The present invention is a method for improving the estimation of physical properties of a material based on the infrared spectrum of the material and the correlation between directly-measured properties of interest and the infrared spectra of a representative set of calibration specimens of the material. By intentionally introducing spectral distortion such as transmittance shifts, wavelength shifts, absorbance-baseline shifts and absorbance-baseline tilts into the infrared spectra of the representative specimens and then determining the correlation between the distorted spectra and the directly-measured properties before applying the correlation to the infrared spectrum of the sample being analyzed, the correlation is self-compensating for the types of distortion introduced.

New Analytical Method of SiO2 Structure by Infrared Reflection Absorption Spectroscopy (Ir-Ras)

Abstract: Simulation of a thin oxide RAS spectrum obtained by using the dielectric function extracted from thick oxide RAS spectra is shown to be a viable method for the comparison of oxide films of differing thickness. Bulk and near-interfacial features of thermally grown SiO2 thin films were studied by this method and it was found that the LO phonon peak at about 1255 cm−1 reflects bulk SiO2 structure and a higher reflectance between 1100 and 1200 cm−1 reflects SiO2/Si interface structure.