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A. Kazimirov
Researcher at Northwestern University
Publications - 5
Citations - 82
A. Kazimirov is an academic researcher from Northwestern University. The author has contributed to research in topics: Diffraction & Thin film. The author has an hindex of 4, co-authored 5 publications receiving 82 citations. Previous affiliations of A. Kazimirov include Max Planck Society.
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Journal ArticleDOI
Polarity determination of a GaN thin film on sapphire (0001) with x-ray standing waves
A. Kazimirov,A. Kazimirov,G. Scherb,Jörg Zegenhagen,T.-L. Lee,Michael J. Bedzyk,M. K. Kelly,H. Angerer,Oliver Ambacher +8 more
TL;DR: In this article, the x-ray standing wave technique was used to determine the polarity of a 1 μm thick GaN film grown by molecular beam epitaxy on an α-Al2O3(0001) single crystal.
Journal ArticleDOI
X-ray surface diffraction analysis of structural transformations on the (001) surface of oxidized SrTiO3
TL;DR: In this article, surface X-ray scattering was used to study structural modifications on the (0 0 1) surface of oxidized SrTiO{sub 3] and revealed a sequence of quasi-powder diffraction peaks originating from crystallites with nearly random in-plane orientation.
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Structural analysis of the indium-stabilized GaAs(001)-c(8×2) surface
T.-L. Lee,T.-L. Lee,Christian Kumpf,A. Kazimirov,Paul F. Lyman,G. Scherb,Michael J. Bedzyk,Michael J. Bedzyk,Mourits Nielsen,Robert Feidenhans'l,Robert L. Johnson,Bjørn-Ove Fimland,Jörg Zegenhagen +12 more
TL;DR: In this paper, the indium-stabilized InAs(001) surface was investigated by surface x-ray diffraction and standing waves, and the reconstruction closely resembles the unified model for clean III-V semiconductor surfaces described by Kumpf et al.
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X-ray standing-wave analysis of the rare-earth atomic positions in RBa2Cu3O7-δ thin films
A. Kazimirov,L. X. Cao,G. Scherb,L. Cheng,Michael J. Bedzyk,Michael J. Bedzyk,Jörg Zegenhagen,Jörg Zegenhagen +7 more
TL;DR: In this paper, the X-ray standing wave technique was applied to study the lattice location of rare earth atoms in thin films of RBa{sub 2}Cu{sub 3}O{sub 7-{delta}} (R=Gd, Pr).
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X-ray standing wave study of Si/Ge/Si(001) heterostructures grown with Bi as a surfactant
W. Rodrigues,W. Rodrigues,B. P. Tinkham,Osami Sakata,T.-L. Lee,A. Kazimirov,Michael J. Bedzyk,Michael J. Bedzyk +7 more
TL;DR: In this paper, X-ray standing wave (XSW) analysis was used for an atomic-scale structural study of ultra-thin Si/Ge heterostructures grown on Si(0 0 1) by surfactant mediated epitaxy with Bi as the surfactants.