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Ajit Kumar Meikap

Researcher at National Institute of Technology, Durgapur

Publications -  189
Citations -  1998

Ajit Kumar Meikap is an academic researcher from National Institute of Technology, Durgapur. The author has contributed to research in topics: Dielectric & Nanocomposite. The author has an hindex of 23, co-authored 169 publications receiving 1699 citations. Previous affiliations of Ajit Kumar Meikap include Indian Association for the Cultivation of Science.

Papers
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Synthesis, electrical and magnetotransport properties of polypyrrole-MWCNT nanocomposite

TL;DR: In this article, the preparation of nanocomposites in which the multiwall carbon nanotubes (MWCNT) have been mixed with conducting polypyrrole (PPy) via an in situ chemical oxidative preparation method is described.
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Electrical transport properties of polyvinyl alcohol–selenium nanocomposite films at and above room temperature

TL;DR: In this article, the authors reported the DC and AC electrical properties of polyvinyl alcohol (PVA)-selenium (Se) nanocomposite films in the temperature (T) range 298 K ≤ T ≤ 420 K and in the frequency (f) range 120 Hz ≤ f ≤ 1 MHz.
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Semiconducting selenium nanoparticles: Structural, electrical characterization, and formation of a back-to-back Schottky diode device

TL;DR: In this paper, a back-to-back Schottky diode device was used to extract the currentvoltage and capacitance-voltage characteristics, ideality parameters, built in voltage, and charge density.
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Electrical transport in doped polypyrrole films at low temperature.

TL;DR: The results of a comprehensive study of localization and electron-electron interaction effects in doped polypyrrole films show the conductivity when temperature T>10 K can be explained by Mott's variable-range hopping model and the density of states and hopping distance can be calculated from these data.
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Electrical transport and optical properties of the composite of polyaniline nanorod with gold

TL;DR: In this article, the synthesis of polyaniline nanorod with gold by chemical oxidative method is reported, in which morphological, structural, optical and electrical transport properties of the samples are characterized by scanning electron microscope with energy dispersive spectroscopy, x-ray diffractometer, fourier transform infra red spectrometer, optical absorption spectro-graph, and low temperature electrical transport measurement.