A
Alexander Mamishev
Researcher at University of Washington
Publications - 121
Citations - 5076
Alexander Mamishev is an academic researcher from University of Washington. The author has contributed to research in topics: Dielectric & Pressboard. The author has an hindex of 30, co-authored 117 publications receiving 4666 citations. Previous affiliations of Alexander Mamishev include Texas A&M University & Massachusetts Institute of Technology.
Papers
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Journal ArticleDOI
Transfer Function of Interfacial Stress Sensor for Artificial Skin Applications
TL;DR: In this article, an interfacial stress sensor is presented which is capable of simultaneously measuring normal compressive stress and horizontal shear stress and is expected to create an artificial skin to understand such load distribution.
Proceedings ArticleDOI
Measurement of moisture spatial profiles in transformer pressboard
TL;DR: In this paper, a flexible interdigital three-wavelength sensor was used to provide the necessary information regarding pressboard dielectric properties at different depths from the sensor-pressboard interface.
Proceedings ArticleDOI
Measurement of dielectric property distributions using interdigital dielectrometry sensors
TL;DR: In this article, the ability of the sensor to characterize multi-layered insulating and semi-insulating materials is investigated, and issues of precision and reliability of the measurements are discussed.
Proceedings ArticleDOI
Optimal heat transfer performance of the microfluidic electrospray cooling devices
Hsiu-Che Wang,Alexander Mamishev +1 more
TL;DR: In this paper, the authors investigated the optimal heat transfer performance of ESEC devices using a different number of nozzles and found that the maximum enhancement ratio of 1.87 was achieved by the 8-nozzle 5 mm spacing ESEC chamber at the lowest heat flux.
Journal ArticleDOI
Nondimensionalized Parametric Modeling of Fringing Electric-Field Sensors
TL;DR: In this article, a parametric model is proposed to improve the design process of FEF sensors by quantifying the effects of design parameters, such as sensor geometry and substrate material.