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Alyssa Mock

Researcher at University of Nebraska–Lincoln

Publications -  28
Citations -  482

Alyssa Mock is an academic researcher from University of Nebraska–Lincoln. The author has contributed to research in topics: Thin film & Ellipsometry. The author has an hindex of 7, co-authored 27 publications receiving 269 citations. Previous affiliations of Alyssa Mock include Linköping University & United States Naval Research Laboratory.

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A review of band structure and material properties of transparent conducting and semiconducting oxides: Ga2O3, Al2O3, In2O3, ZnO, SnO2, CdO, NiO, CuO, and Sc2O3

TL;DR: In this paper , a review of basic and transition metal conducting and semiconducting oxides is presented, with an emphasis on the crystal, electronic, and band structures of the oxides.
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Electron effective mass in Sn-doped monoclinic single crystal β-gallium oxide determined by mid-infrared optical Hall effect

TL;DR: In this article, the isotropic average conduction band minimum electron effective mass in Sn-doped monoclinic single crystal β-Ga2O3 was experimentally determined by the mid-infrared optical Hall effect to be (0.284 ± 0.013)m0 combining investigations on (010) and ( 2¯01) surface cuts.
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Electron effective mass in Sn-doped monoclinic single crystal $\beta$-gallium oxide determined by mid-infrared optical Hall effect

TL;DR: In this article, the isotropic average conduction band minimum electron effective mass in Sn-doped monoclinic single crystal was experimentally determined by mid-infrared optical Hall effect to be $(0.284\pm 0.013)m_{0}$ combining investigations on ($010$) and ($bar{2}01$) surface cuts.
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Anisotropy, phonon modes, and lattice anharmonicity from dielectric function tensor analysis of monoclinic cadmium tungstate

TL;DR: Schubert et al. as discussed by the authors derived the frequency dependence of four independent Cartesian tensor elements of the dielectric function using generalized spectroscopic ellipsometry within mid-infrared and far-inrared spectral regions, which can be obtained completely without physical model line-shape analysis in materials with monoclinic symmetry.