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Anfeng Huang

Researcher at Missouri University of Science and Technology

Publications -  18
Citations -  53

Anfeng Huang is an academic researcher from Missouri University of Science and Technology. The author has contributed to research in topics: Wireless power transfer & Power (physics). The author has an hindex of 3, co-authored 10 publications receiving 18 citations.

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Journal ArticleDOI

A Multilevel Gate Driver of SiC mosfet s for Mitigating Coupling Noise in Bridge-Leg Converter

TL;DR: In this article, a multilevel gate driver is proposed to mitigate the coupling noise effectively, which adds a capacitor, an auxiliary mosfet, a Zener diode, and two resistors to regulate the turn-off voltage bias.
Journal ArticleDOI

Accurate Rectifier Characterization and Improved Modeling of Constant Power Load Wireless Power Transfer Systems

TL;DR: This article presents a system-level model for WPT applications, including all the critical interior blocks, such as power amplifier, transmitter coil, receiver coil, matching networks, and rectifier, and an accurate characterization method is proposed to obtain the rectifier impedance as a realistic load condition.
Journal ArticleDOI

Analysis and Introduction of Effective Permeability with Additional Air-Gaps on Wireless Power Transfer Coils for Electric Vehicle Based on SAE J2954 Recommended Practice

TL;DR: In this article, a method for adjusting the effective permeability of the ferrite blocks in the standard model, to tune the self-inductance of the coils as well as the coupling coefficient was proposed.
Proceedings ArticleDOI

Electric Parameter Tuning of Wireless Power Transfer Coil for Charging Interoperability of Electric Vehicles

TL;DR: In this paper, the authors introduced the method of tuning the coil's inductance and coupling coefficient by adjusting the effective permeability of the ferrite blocks, and obtained reasonable electrical parameters; inductance of ground-assembly coil, inductances of vehicle assembly coil, and coupling coefficients.
Proceedings ArticleDOI

Investigation and Mitigation of Radio Frequency Interference Caused by Weak Grounding of USB Type-C Receptacle Connector

TL;DR: In this paper, the root cause of desense noise is identified as the non-ideal electrical connection between the metal chassis and the USB receptacle shell where it is installed.