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Modern Applied Statistics With S

Core/Shell Nanoparticles: Classes, Properties, Synthesis Mechanisms, Characterization, and Applications

This review covers important advances in recent years in the physics of thin-film ferroelectric oxides, the strongest emphasis being on those aspects particular to ferroelectrics in thin-film form. The authors introduce the current state of development in the application of ferroelectric thin films for electronic devices and discuss the physics relevant for the performance and failure of these devices. Following this the review covers the enormous progress that has been made in the first-principles computational approach to understanding ferroelectrics. The authors then discuss in detail the important role that strain plays in determining the properties of epitaxial thin ferroelectric films. Finally, this review ends with a look at the emerging possibilities for nanoscale ferroelectrics, with particular emphasis on ferroelectrics in nonconventional nanoscale geometries.

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Physics of thin-film ferroelectric oxides

International study of the prevalence and outcomes of infection in intensive care units

Development of high strength hydroxyapatite by solid-state-sintering process

In this paper, we report on the effect of Sm doping on the phase evolution and properties of phase-pure Bi1−xSmxFeO3 (BSFO) ceramics synthesized via a conventional solid-state-reaction method. We find that upon calcination, Sm doping of bismuth ferrite promotes the formation of perovskitic phase and leads to the elimination of the secondary phases. On the other hand, undoped compositions do not yield completely phase-pure samples and contain secondary phases such as Bi25FeO40. Differential thermal analysis corroborates the sequence of phase evolution as examined from the x-ray diffraction patterns. A thermodynamic analysis, based on the bond energy, has been carried out to explain the effect of doping on the stabilization of perovskite structured phase upon Sm doping and is well supported by the thermal analysis results. Vibrating sample magnetometry measurements show that BSFO samples possess higher room temperature remnant magnetization than the undoped samples. Temperature dependent magnetic measuremen...

Phase evolution, magnetic and electrical properties in Sm-doped bismuth ferrite

Epitaxial (001)-, (118)-, and (104)-oriented Nd-doped Bi4Ti3O12 films have been grown by pulsed-laser deposition from a Bi4−xNdxTi3O12 (x=0.85) target on SrRuO3 coated single-crystal (100)-, (110)-, and (111)-oriented SrTiO3 substrates, respectively. X-ray diffraction illustrated a unique epitaxial relationship between film and substrate for all orientations. We observed a strong dependence of ferroelectric properties on the film orientation, with no ferroelectric activity in an (001)-oriented film; a remanent polarization 2Pr of 12 μC/cm2 and coercive field Ec of 120 kV/cm in a (118)-oriented film; and 2Pr=40 μC/cm2, Ec=50 kV/cm in a (104)-oriented film. The lack of ferroelectric activity along the c-axis is consistent with the orthorhombic nature of the crystal structure of the bulk material, as determined by powder neutron diffraction.

/pdf/orientation-dependence-of-ferroelectric-properties-of-pulsed-2aookxutno.pdf

Orientation dependence of ferroelectric properties of pulsed-laser-ablated Bi4−xNdxTi3O12 films

Epitaxial (001)-, (118)-, and (104)-oriented Nd-doped Bi4Ti3O12 films have been grown by pulsed-laser deposition from a Bi4-xNdxTi3O12 (x=0.85) target on SrRuO3 coated single-crystal (100)-, (110)-, and (111)-oriented SrTiO3 substrates, respectively. X-ray diffraction illustrated a unique epitaxial relationship between film and substrate for all orientations. We observed a strong dependence of ferroelectric properties on the film orientation, with no ferroelectric activity in an (001)-oriented film; a remanent polarization, 2Pr, of 12 microC/cm2 and coercive field, Ec, of 120 kV/cm in a (118)-oriented film; and 2Pr = 40 microC/cm2, Ec = 50 kV/cm in a (104)-oriented film. The lack of ferroelectric activity along the c-axis is consistent with the orthorhombic nature of the crystal structure of the bulk material, as determined by powder neutron diffraction.

/pdf/orientation-dependence-of-ferroelectric-properties-of-pulsed-23plerlasa.pdf

Ashish Garg

Papers

Development of high strength hydroxyapatite by solid-state-sintering process

Phase evolution, magnetic and electrical properties in Sm-doped bismuth ferrite

Orientation dependence of ferroelectric properties of pulsed-laser-ablated Bi4−xNdxTi3O12 films

Orientation Dependence of Ferroelectric Properties of Pulsed-Laser-Ablated Bi4-xNdxTi3O12 Films

Effect of samarium doping on the properties of solid-state synthesized multiferroic bismuth ferrite