B
Bichen Chen
Researcher at Missouri University of Science and Technology
Publications - 27
Citations - 311
Bichen Chen is an academic researcher from Missouri University of Science and Technology. The author has contributed to research in topics: Test fixture & Fixture. The author has an hindex of 9, co-authored 24 publications receiving 212 citations. Previous affiliations of Bichen Chen include Facebook.
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Proceedings ArticleDOI
A novel de-embedding method suitable for transmission-line measurement
TL;DR: A novel de-embedding method on transmission line device under testing (DUT) is introduced, which can be used as an alternative to classic calibration approaches, such as SOLT, TRL, LRM, or LRRM whenever the de- embedded structure is a transmission line.
Proceedings ArticleDOI
Analytical and numerical sensitivity analyses of fixtures de-embedding
TL;DR: In this article, analytical and numerical techniques are used to perform sensitivity studies on both simulation and measurement data, with respect to de-embedding procedures, resulting in amplified errors, which can propagate through deembedding procedure, leading to amplified errors.
Journal ArticleDOI
Improved “Root-Omega” Method for Transmission-Line-Based Material Property Extraction for Multilayer PCBs
TL;DR: Based on the electrical properties of fabricated transmission lines, the improved Root-Omega method applied to cases with smooth and rough conductors is validated using simulations in this article, and the error sensitivity is significantly reduced by the proposed improvements.
Journal ArticleDOI
Thru-Reflect-Line Calibration Technique: Error Analysis for Characteristic Impedance Variations in the Line Standards
TL;DR: In this article, the authors analyzed the impact of characteristic impedance variations among standards on the accuracy of the thru-reflect-line (TRL) calibration technique and derived the expressions of the calibration coefficient errors due to the manufacturing tolerances.
Journal ArticleDOI
Multi-Ports ( [$2^{n}$ ) 2×-Thru De-Embedding: Theory, Validation, and Mode Conversion Characterization
TL;DR: The theory of the 2×-thru de-embedding is derived and the self-error reduction schemes are introduced to mitigate the de- embedding errors due to non-ideal manufacturing effects that make mode conversion terms non-zero.