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Bobby G. Sumpter

Researcher at Oak Ridge National Laboratory

Publications -  652
Citations -  28014

Bobby G. Sumpter is an academic researcher from Oak Ridge National Laboratory. The author has contributed to research in topics: Polymer & Graphene. The author has an hindex of 60, co-authored 619 publications receiving 23583 citations. Previous affiliations of Bobby G. Sumpter include University of Florida & Cornell University.

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Journal ArticleDOI

Combatting ionic aggregation using dielectric forces—combining modeling/simulation and experimental results to explain end-capping of primary amine functionalized polystyrene

TL;DR: In this paper, a chain-end functionalization of living poly(styryl)lithium using 1-(3-bromopropyl)-2,2,5,5-tetramethyl-1-aza-2, 5-disilacyclo-pentane (BTDP) to generate primary amine end-functionalized polystyrene was investigated using high vacuum anionic polymerization techniques.
Book ChapterDOI

Evaluation of Stripping Resistance of Organoclay-Modified Asphalt Binder and Aggregate Systems Using an Optical Contact Angle Analyzer

TL;DR: In this paper, the authors evaluate the changes in moisture resistance of different nanoclays (NCs) modified asphalt binders through the surface free energy (SFE) technique, which is derived from static contact angle (SCA) data measured from an optical contact angle analyzer (OCA).
Journal ArticleDOI

Anti-polyelectrolyte and polyelectrolyte effects on conformations of polyzwitterionic chains in dilute aqueous solutions

TL;DR: In this article , the effects of added salt [potassium bromide (KBr)] on gyration and hydrodynamic radii of poly(sulfobetaine methacrylate) in dilute aqueous solutions using dynamic light scattering and small-angle X-ray scattering, respectively.
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Probing static discharge of polymer surfaces with nanoscale resolution

TL;DR: In-situ quantification of tribological charging with nanoscale resolution is demonstrated, that is applicable to a wide range of dielectric systems and highlights the complex phenomena of electrostatic discharge upon contact formation to pre-charged surfaces, and directly reveals the mobility of surface charges.