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Carlos Alberto Mendes Moraes

Researcher at Universidade do Vale do Rio dos Sinos

Publications -  96
Citations -  959

Carlos Alberto Mendes Moraes is an academic researcher from Universidade do Vale do Rio dos Sinos. The author has contributed to research in topics: Husk & Raw material. The author has an hindex of 13, co-authored 83 publications receiving 726 citations.

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Chemical, physical, structural and morphological characterization of the electric arc furnace dust.

TL;DR: A chemical, physical, structural and morphological characterization of the EAFD is carried out by using granulometry analysis, chemical analysis, scanning electron microscopy (SEM), energy dispersive spectroscopy via SEM, X-ray diffraction (XRD) and MössbauerSpectroscopy.
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Characterization of rice husk ash produced using different biomass combustion techniques for energy

TL;DR: In this paper, the physical, chemical, thermal, mineralogical, and morphological characteristics of three types of RHA, produced according to three distinct methods (grate furnace, fluidized bed, and suspension/entrained combustion).
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Review of the rice production cycle: by-products and the main applications focusing on rice husk combustion and ash recycling.

TL;DR: The findings point to the existence of an environmentally suitable use for all wastes from the rice production cycle, which shows potential to be used as a by-product in many different applications, but not yet consolidated.
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Characterization of Silica Produced from Rice Husk Ash: Comparison of Purification and Processing Methods

TL;DR: In this article, a literature review was conducted, and then selected techniques were used to produce silica, which was characterized by XRF, XRD, particle sizing, specific weight, specific surface area, total carbon, and SEM.
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Nitrided layer embrittlement due to edge effect on duplex treated AISI M2 high-speed steel

TL;DR: In this paper, the authors used optical and scanning electron microscopy, microhardness test, glow discharge optical emission spectroscopy (GDOES) and X-ray diffraction (XRD) to characterize the nitrided layer.