IEEE transactions on computer-aided design of integrated circuits and systems : a publication of the IEEE Circuits and Systems Society

This paper presents a novel test-data volume-compression methodology called the embedded deterministic test (EDT), which reduces manufacturing test cost by providing one to two orders of magnitude reduction in scan test data volume and scan test time. The presented scheme is widely applicable and easy to deploy because it is based on the standard scan/ATPG methodology and adopts a very simple flow. It is nonintrusive as it does not require any modifications to the core logic such as the insertion of test points or logic bounding unknown states. The EDT scheme consists of logic embedded on a chip and a new deterministic test-pattern generation technique. The main contributions of the paper are test-stimuli compression schemes that allow us to deliver test data to the on-chip continuous-flow decompressor. In particular, it can be done by repeating certain patterns at the rates, which are adjusted to the requirements of the test cubes. Experimental results show that for industrial circuits with test cubes with very low fill rates, ranging from 3% to 0.2%, these schemes result in compression ratios of 30 to 500 times. A comprehensive analysis of the encoding efficiency of the proposed compression schemes is also provided.

Embedded deterministic test

VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

· Most up-to-date coverage of design for testability. 
· Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. 
· Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
· Lecture slides and exercise solutions for all chapters are now available.
· Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.

Table of Contents

Chapter 1 - Introduction
Chapter 2 - Design for Testability
Chapter 3 - Logic and Fault Simulation 
Chapter 4 - Test Generation 
Chapter 5 - Logic Built-In Self-Test
Chapter 6 - Test Compression
Chapter 7 - Logic Diagnosis
Chapter 8 - Memory Testing and Built-In Self-Test
Chapter 9 - Memory Diagnosis and Built-In Self-Repair
Chapter 10 - Boundary Scan and Core-Based Testing
Chapter 11 - Analog and Mixed-Signal Testing
Chapter 12 - Test Technology Trends in the Nanometer Age

VLSI Test Principles and Architectures: Design for Testability

This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an "adjacent" field will find this an invaluable reference to the basic EDA concepts, principles, data structures, algorithms, and architectures for the design, verification, and test of VLSI circuits. Anyone who needs to learn the concepts, principles, data structures, algorithms, and architectures of the EDA flow will benefit from this book.


Covers complete spectrum of the EDA flow, from ESL design modeling to logic/test synthesis, verification, physical design, and test - helps EDA newcomers to get "up-and-running" quickly 
Includes comprehensive coverage of EDA concepts, principles, data structures, algorithms, and architectures - helps all readers improve their VLSI design competence 
Contains latest advancements not yet available in other books, including Test compression, ESL design modeling, large-scale floorplanning, placement, routing, synthesis of clock and power/ground networks - helps readers to design/develop testable chips or products 
Includes industry best-practices wherever appropriate in most chapters - helps readers avoid costly mistakes



Table of Contents


Chapter 1: Introduction Chapter 2: Fundamentals of CMOS Design Chapter 3: Design for Testability Chapter 4: Fundamentals of Algorithms Chapter 5: Electronic System-Level Design and High-Level Synthesis Chapter 6: Logic Synthesis in a Nutshell Chapter 7: Test Synthesis Chapter 8: Logic and Circuit Simulation Chapter 9:?Functional Verification Chapter 10: Floorplanning Chapter 11: Placement Chapter 12: Global and Detailed Routing Chapter 13: Synthesis of Clock and Power/Ground Networks Chapter 14: Fault Simulation and Test Generation.

Electronic Design Automation: Synthesis, Verification, and Test

This paper introduces a finite memory compactor called convolutional compactor that provides compaction ratios of test responses in excess of 100x even for a very small number of outputs. This is combined with the capability to detect multiple errors, handling of unknown states, and the ability to diagnose failing scan cells directly from compacted responses. A convolutional compactor can be easily configured into a MISR that preserves most of these properties. Experimental results demonstrate the efficiency of compaction for several industrial circuits.

Convolutional compaction of test responses

In this paper, a new ATPG methodology is proposed to improve the quality of test sets generated for detecting delay defects. This is achieved by integrating timing information, e.g. from Standard Delay Format (SDF) files, into the ATPG tool. The timing information is used to guide the test generator to detect faults through the longest paths in order to improve the ability to detect small delay detects. To avoid propagating faults through similar paths repeatedly, a weighted random method is proposed to improve the path coverage during test generation. During fault simulation, a new fault-dropping criterion, named Dropping based on Slack Margin (DSM), is proposed to facilitate the trade-off between the test set quality and the test pattern count. The quality of the generated test set is measured by two metrics: delay test coverage and SDQL. The experimental results show that significant test quality improvement is achieved when applying timing-aware ATPG with DSM to industrial designs.

Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects

This paper introduces a new class of finite memory compaction schemes called convolutional compactors (CCs). They provide compaction ratios of test responses in excess of 100/spl times/, even for a very small number of outputs. This is combined with the capability to detect multiple errors, handling of unknown states, and the ability to diagnose failing scan cells directly from compacted responses. The CCs can also be used to significantly enhance conventional multiple input signature registers. Experimental results presented in the paper demonstrate the efficiency of convolutional compaction for several industrial circuits.

Finite memory test response compactors for embedded test applications

The present disclosure describes embodiments of a compactor for compressing test results in an integrated circuit and methods for using and designing such embodiments. The disclosed compactors can be utilized, for example, as part of any scan-based design. Moreover, any of the disclosed compactors can be designed, simulated, and/or verified in a computer-executed application, such as an electronic-design-automation (“EDA”) software tool. Embodiments of a method for diagnosing faults in the disclosed compactor embodiments are also described.

Compressing test responses using a compactor

The design of a test response compactor called a Block Compactor is given. Block Compactors belong to a new class of compactors called Finite Memory Compactors. Different from space compactors, finite memory compactors contain memory elements. Also unlike time compactors, finite memory compactors have finite impulse response. These properties give finite memory compactors the ability to achieve higher compaction ratios than space compactors and still be able to tolerate unknown values in test responses. The proposed Block Compactors, as an instance of finite memory compactors generate a signature of response data in several scan cycles. Results presented on several industrial designs show that Block Compactors provide better test quality and higher data compaction than earlier works on test response compactors.

Chen Wang

Papers

Convolutional compaction of test responses

Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects

Finite memory test response compactors for embedded test applications

Compressing test responses using a compactor

On Compacting Test Response Data Containing Unknown Values