There is, I think, something ethereal about i —the square root of minus one. I remember first hearing about it at school. It seemed an odd beast at that time—an intruder hovering on the edge of reality.

Usually familiarity dulls this sense of the bizarre, but in the case of i it was the reverse: over the years the sense of its surreal nature intensified. It seemed that it was impossible to write mathematics that described the real world in …

I and i

다중혈관 관상동맥 환자에서 y-문합을 이용하여 양쪽 내흉동맥만을 사용한 우회술의 조기 성적

我的台灣, 看見心靈的故鄉 =2009林磐聳藝術與設計展

Single-event upsets from particle strikes have become a key challenge in microprocessor design. Techniques to deal with these transients faults exist, but come at a cost. Designers clearly require accurate estimates of processor error rates to make appropriate cost/reliability tradeoffs. This paper describes a method for generating these estimates. A key aspect of this analysis is that some single-bit faults (such as those occurring in the branch predictor) do not produce an error in a program's output. We define a structure's architectural vulnerability factor (AVF) as the probability that a fault in that particular structure do not result in an error. A structure's error rate is the product of its raw error rate, as determined by process and circuit technology, and the AVF. Unfortunately, computing AVFs of complex structures, such as the instruction queue, can be quite involved. We identify numerous cases, such as prefetches, dynamically dead code, and wrong-path instructions, in which a fault do not affect, correct execution. We instrument a detailed 1A64 processor simulator to map bit-level microarchitectural state to these cases, generating per-structure AVF estimates. This analysis shows AVFs of 28% and 9% for the instruction queue and execution units, respectively, averaged across dynamic sections of the entire CPU2000 benchmark suite.

/pdf/a-systematic-methodology-to-compute-the-architectural-gnuelfzd79.pdf

A systematic methodology to compute the architectural vulnerability factors for a high-performance microprocessor

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[서평]「Computer Organization and Design, The Hardware/Software Interface」

Reduction of power dissipation during test application is studied for scan designs and for combinational circuits tested using built-in self-test (BIST). The problems are shown to be intractable. Heuristics to solve these problems are discussed. We show that heuristics with good performance bounds can be derived for combinational circuits tested using BIST. Experimental results show that considerable reduction in power dissipation can be obtained using the proposed techniques.

Techniques for minimizing power dissipation in scan and combinational circuits during test application

Heuristics to aid the derivation of small test sets that detect single stuck-at faults in combinational logic circuits are proposed. The heuristics can be added to existing test pattern generators without compromising fault coverage. Experimental results obtained by adding the proposed heuristics to a simple PODEM procedure and applying it to the ISCAS-85 and fully-scanned ISCAS-89 benchmark circuits are presented to substantiate the effectiveness of the proposed heuristics. >

COMPACTEST: a method to generate compact test sets for combinational circuits

To address the increasing susceptibility of commodity chip multiprocessors (CMPs) to transient faults, we propose Chiplevel Redundantly Threaded multiprocessor with Recovery (CRTR). CRTR extends the previously-proposed CRT for transient-fault detection in CMPs, and the previously-proposed SRTR for transient-fault recovery in SMT. All these schemes achieve fault tolerance by executing and comparing two copies, called leading and trailing threads, of a given application. Previous recovery schemes for SMT do not perform well on CMPs. In a CMP, the leading and trailing threads execute on different processors to achieve load balancing and reduce the probability of a fault corrupting both threads; whereas in an SMT, both threads execute on the same processor. The inter-processor communication required to compare the threads introduces latency and bandwidth problems not present in an SMT.To hide inter-processor latency, CRTR executes the leading thread ahead of the trailing thread by maintaining a long slack, enabled by asymmetric commit. CRTR commits the leading thread before checking and the trailing thread after checking, so that the trailing thread state may be used for recovery. Previous recovery schemes commit both threads after checking, making a long slack suboptimal. To tackle inter-processor bandwidth, CRTR not only increases the bandwidth supply by pipelining the communication paths, but also reduces the bandwidth demand. By reasoning that faults propagate through dependences, previously-proposed Dependence-Based Checking Elision (DBCE) exploits (true) register dependence chains so that only the value of the last instruction in a chain is checked. However, instructions that mask operand bits may mask faults and limit the use of dependence chains. We propose Death- and Dependence-Based Checking Elision (DDBCE), which chains a masking instruction only if the source operand of the instruction dies after the instruction. Register deaths ensure that masked faults do not corrupt later computation. Using SPEC2000, we show that CRTR incurs negligible performance loss compared to CRT for inter-processor (one-way) latency as high as 30 cycles, and that the bandwidth requirements of CRT and CRTR with DDBCE are 5.2 and 7.1 bytes/cycle, respectively.

/pdf/transient-fault-recovery-for-chip-multiprocessors-36a8bh52gn.pdf

Transient-fault recovery for chip multiprocessors

We propose a scheme for transient-fault recovery called Simultaneously and Redundantly Threaded processors with Recovery (SRTR) that enhances a previously proposed scheme for transient-fault detection, called Simultaneously and Redundantly Threaded (SRT) processors. SRT replicates an application into two communicating threads, one executing ahead of the other. The trailing thread repeats the computation performed by the leading thread, and the values produced by the two threads are compared. In SRT, a leading instruction may commit before the check for faults occurs, relying on the trailing thread to trigger detection. In contrast, SRTR must not allow any leading instruction to commit before checking occurs, since a faulty instruction cannot be undone once the instruction commits.To avoid stalling leading instructions at commit while waiting for their trailing counterparts, SRTR exploits the time between the completion and commit of leading instructions. SRTR compares the leading and trailing values as soon as the trailing instruction completes, typically before the leading instruction reaches the commit point. To avoid increasing the bandwidth demand on the register file for checking register values, SRTR uses the register value queue (RVQ) to hold register values for checking. To reduce the bandwidth pressure on the RVQ itself, SRTR employs dependence-based checking elision (DBCE). By reasoning that faults propagate through dependent instructions, DBCE exploits register (true) dependence chains so that only the last instruction in a chain uses the RVQ, and has the leading and trailing values checked. SRTR performs within 1% and 7% of SRT for SPEC95 integer and floating-point programs, respectively: While SRTR without DBCE incurs about 18% performance loss when the number of RVQ ports is reduced from four (which is performance-equivalent to an unlimited number) to two ports, with DBCE, a two-ported RVQ performs within 2% of a four-ported RVQ.

/pdf/transient-fault-recovery-using-simultaneous-multithreading-7a328f60mh.pdf

Transient-fault recovery using simultaneous multithreading

When the response to a test vector is captured by state elements in scan based tests, the switching activity of the circuit may be large resulting in abnormal power dissipation and supply current demand High supply current may cause excessive supply voltage droops leading to larger gate delays which may cause good chips to fail tests This paper presents a scalable approach called Preferred Fill to reduce average and peak power dissipation during capture cycles of launch off capture delay fault tests Experimental results presented for benchmark and industrial circuits demonstrate the effectiveness of the proposed method

Irith Pomeranz

Papers

Techniques for minimizing power dissipation in scan and combinational circuits during test application

COMPACTEST: a method to generate compact test sets for combinational circuits

Transient-fault recovery for chip multiprocessors

Transient-fault recovery using simultaneous multithreading

Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs