D
D.L. Coblentz
Researcher at Bell Labs
Publications - 34
Citations - 1001
D.L. Coblentz is an academic researcher from Bell Labs. The author has contributed to research in topics: Semiconductor laser theory & Laser. The author has an hindex of 16, co-authored 34 publications receiving 991 citations.
Papers
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Journal ArticleDOI
Room temperature operation of microdisc lasers with submilliamp threshold current
A. F. J. Levi,Richart E. Slusher,S. L. McCall,Tawee Tanbun-Ek,D.L. Coblentz,Stephen J. Pearton +5 more
TL;DR: In this article, a whispering-gallery mode microdisc laser with singlemode operation and submilliamp threshold current at room temperature was demonstrated, and it was shown that the single-mode operation can achieve sub-milliamps threshold current.
Journal ArticleDOI
Mode-locked hybrid soliton pulse source with extremely wide operating frequency range
Paul A. Morton,Victor Mizrahi,Peter A. Andrekson,Tawee Tanbun-Ek,Ralph A. Logan,P. Lemaire,D.L. Coblentz,A.M. Sergent,K.W. Wecht,P.F. Sciortino +9 more
TL;DR: In this paper, a mode-locked pulse source with extremely wide operating frequency range and very stable operation, through the use of a long, linearly chirped Bragg reflector as the output coupler integrated in a fiber external cavity.
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Frequency response subtraction for simple measurement of intrinsic laser dynamic properties
TL;DR: In this paper, a new technique for extracting the intrinsic laser-diode dynamic properties accurately is described, which eliminates the need for accurate microwave calibration of the test equipment and problems of microwave reflections, nonideal frequency response of laser mount, and detector.
Journal ArticleDOI
High temperature characteristics of InGaAsP/InP laser structures
Henryk Temkin,D.L. Coblentz,R. A. Logan,J. P. van der Ziel,T. Tanbun-Ek,R. D. Yadvish,Arthur Mike Sergent +6 more
TL;DR: In this paper, the authors investigate the high temperature performance of conventional separate confinement and lattice matched and compressively strained multi-quantum-well InGaAsP lasers emitting at 1.3 μm.
Journal ArticleDOI
Novel technique for determining internal loss of individual semiconductor lasers
TL;DR: In this paper, a novel and accurate technique for measuring the internal losses of semiconductor laser chips is demonstrated, which is based on two measurements: the injection current required for reaching material transparency and the corresponding ripple in the spontaneous emission spectrum.