D
D. Wristers
Publications - 1
Citations - 88
D. Wristers is an academic researcher. The author has contributed to research in topics: Time-dependent gate oxide breakdown & Gate dielectric. The author has an hindex of 1, co-authored 1 publications receiving 88 citations.
Papers
More filters
Journal ArticleDOI
Degradation of oxynitride gate dielectric reliability due to boron diffusion
TL;DR: In this article, the impact of the suppression of boron diffusion via nitridation of SiO2 on gate oxide integrity and device reliability was investigated using oxynitride gate dielectrics.