D
Dan Mordehai
Researcher at Technion – Israel Institute of Technology
Publications - 46
Citations - 1035
Dan Mordehai is an academic researcher from Technion – Israel Institute of Technology. The author has contributed to research in topics: Dislocation & Plasticity. The author has an hindex of 16, co-authored 40 publications receiving 820 citations. Previous affiliations of Dan Mordehai include Tel Aviv University.
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Introducing dislocation climb by bulk diffusion in discrete dislocation dynamics
TL;DR: In this paper, a method to incorporate dislocation climb controlled by bulk diffusion in a three-dimensional discrete dislocation dynamics (DDD) simulation for fcc metals is presented. But the model is not suitable for climbing-related phenomena.
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Size effect in compression of single-crystal gold microparticles
Dan Mordehai,Seok Woo Lee,Björn Backes,David J. Srolovitz,David J. Srolovitz,William D. Nix,Eugen Rabkin +6 more
TL;DR: In this article, single-crystal Au microparticles on a sapphire substrate were deformed under compression and it was shown that the deformation is dislocation nucleation controlled and that the stress levels reached at the onset of plasticity approach the theoretical shear strength of Au.
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Nanoindentation size effect in single-crystal nanoparticles and thin films: A comparative experimental and simulation study
TL;DR: In this paper, a dewetting method was employed to produce an ensemble of faceted, single-crystal, defect-free gold nanoparticles on sapphire substrates.
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Solid–solid interface reconstruction at equilibrated Ni–Al2O3 interfaces
TL;DR: In this paper, the atomistic structure of solid Ni-Al2O3 interfaces at equilibrium was determined by aberration-corrected transmission electron microscopy, from specimens formed during solid-state dewetting of thin Ni films on the surface of α-Al 2O3.
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Signature of dislocations and stacking faults of face‐centred cubic nanocrystals in coherent X‐ray diffraction patterns: a numerical study
Maxime Dupraz,Maxime Dupraz,Guillaume Beutier,Guillaume Beutier,David Rodney,David Rodney,David Rodney,Dan Mordehai,Marc Verdier,Marc Verdier +9 more
TL;DR: Realistic defects in face-centred cubic nanocrystals are studied numerically, revealing various signatures in diffraction patterns depending on the Miller indices and providing an identification method.