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David C. Miller

Researcher at National Renewable Energy Laboratory

Publications -  161
Citations -  8482

David C. Miller is an academic researcher from National Renewable Energy Laboratory. The author has contributed to research in topics: Photovoltaic system & Thin film. The author has an hindex of 34, co-authored 159 publications receiving 7512 citations. Previous affiliations of David C. Miller include North Carolina State University & Hoffmann-La Roche.

Papers
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Journal ArticleDOI

Item-Specific Efficacy Judgments in Mathematical Problem Solving: The Downside of Standing Too Close to Trees in a Forest

Herbert W. Marsh, +3 more
- 01 Jul 1997 - 
TL;DR: Researchers are encouraged to use similar but not identical items to assess self-efficacy and performance, a construct validity approach to interrogate their interpretations, more diverse outcome measures, and SEM approaches like those demonstrated here.
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To Achieve or Not To Achieve: A Self-Regulation Perspective on Adolescents' Academic Decision Making.

David C. Miller, +1 more
- 01 Dec 2001 - 
TL;DR: In this paper, the authors investigated the utility of the self-regulation model of decision making for explaining and predicting adolescents' academic decision making Participants were mostly 9th and 1 lth graders.
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Analysis of transmitted optical spectrum enabling accelerated testing of multijunction concentrating photovoltaic designs

David C. Miller, +3 more
- 01 Jan 2011 - 
TL;DR: In this article, the authors evaluated the performance of concentrating photovoltaic (CPV) modules using optical properties (transmittance, refractive index, reflectance, and absorptance) of PMMA, soda-lime glass, borosilicate glass, and quartz refractors.
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Environmental mechanisms of debonding in photovoltaic backsheets

Fernando D. Novoa, +2 more
- 01 Jan 2014 - 
TL;DR: In this article, the effect of aging on backsheet debond energy, including the separate effect of temperature, mechanical stress and relative humidity on debond growth rate, was investigated using a newly developed quantitative mechanics technique.
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Alternative dielectric films for rf MEMS capacitive switches deposited using atomic layer deposited Al2O3/ZnO alloys

Cari F. Herrmann, +8 more
- 30 Mar 2007 - 
TL;DR: In this paper, the dielectric constants of the Al2O3/ZnO ALD alloys films were calculated to be similar to pure Al 2O3 ALD, being ∼7.27nm.