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David P. Adams
Researcher at Sandia National Laboratories
Publications - 161
Citations - 3414
David P. Adams is an academic researcher from Sandia National Laboratories. The author has contributed to research in topics: Focused ion beam & Thin film. The author has an hindex of 32, co-authored 161 publications receiving 2945 citations. Previous affiliations of David P. Adams include University of Michigan & East Tennessee State University.
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Reactive multilayers fabricated by vapor deposition. A critical review
TL;DR: Reactive multilayer thin films are a class of energetic materials that continue to attract attention for use in joining applications and as igniters as discussed by the authors, with most of these materials fabricated by magnetron sputter deposition or electron-beam evaporation.
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Micromilling of metal alloys with focused ion beam–fabricated tools
TL;DR: In this paper, focused ion beam sputtering and ultra-precision machining are combined for fabricating metal alloy microcomponents, and a 20 keV focused gallium ion beam is used to define a number of cutting edges and tool end clearance.
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Phosphorylated FADD induces NF-κB, perturbs cell cycle, and is associated with poor outcome in lung adenocarcinomas
Guoan Chen,Mahaveer S. Bhojani,Andrew C. Heaford,Daniel C. Chang,Bharathi Laxman,Dafydd G. Thomas,Laura B. Griffin,James Yu,Julia M. Coppola,Thomas J. Giordano,Lin Lin,David P. Adams,Mark B. Orringer,Brian D. Ross,David G. Beer,Alnawaz Rehemtulla +15 more
TL;DR: It is demonstrated that induction of NF-kappaB activity and its effects on cell-cycle progression may represent a molecular basis underlying the aggressive tumor behavior associated with elevated p-FADD expression in lung adenocarcinoma.
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DNA translocation through an array of kinked nanopores
Zhu Chen,Ying-Bing Jiang,Darren R. Dunphy,David P. Adams,Carter Hodges,Nanguo Liu,Nan Zhang,George Xomeritakis,Xiaozhong Jin,Narayana R. Aluru,Steven J. Gaik,Hugh W. Hillhouse,C. Jeffrey Brinker,C. Jeffrey Brinker +13 more
TL;DR: In this article, the formation of kinked silica nanopores, using evaporation-induced self-assembly, and their further tuning and chemical derivatization using atomic-layer deposition, is reported.
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Focused ion beam-shaped microtools for ultra-precision machining of cylindrical components
TL;DR: Focused ion beam (FIB) sputtering is used to shape a variety of cutting tools with dimensions in the 15-100-μm range and cutting edge radii of curvature of 40-nm.