M
Michael J. Vasile
Researcher at Louisiana Tech University
Publications - 24
Citations - 769
Michael J. Vasile is an academic researcher from Louisiana Tech University. The author has contributed to research in topics: Focused ion beam & Machining. The author has an hindex of 13, co-authored 24 publications receiving 752 citations.
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Development of the micromilling process for high-aspect-ratio microstructures
TL;DR: In this article, the focused-ion beam machining process is used to create trench-like features with nearly vertical sidewalls and good smoothness, which can be used to fabricate mold and mask features.
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Micromilling of metal alloys with focused ion beam–fabricated tools
TL;DR: In this paper, focused ion beam sputtering and ultra-precision machining are combined for fabricating metal alloy microcomponents, and a 20 keV focused gallium ion beam is used to define a number of cutting edges and tool end clearance.
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Microgrooving and microthreading tools for fabricating curvilinear features
TL;DR: In this article, focused ion beam sputtering is used to fabricate microscopic, curvilinear features in a variety of workpiece materials, such as polymethyl methacrylate and 6061 Al cylindrical workplaces.
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Micrometer-scale machining: tool fabrication and initial results
TL;DR: In this paper, a tool geometry for nominal 25 micrometer diameter cutting tools was found that cuts polymethyl methacrylate (PMMA) with sub-micrometer tolerances over trench lengths of 2 mm.
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Depth control of focused ion-beam milling from a numerical model of the sputter process
TL;DR: In this article, a mathematical model of focused ion-beam milling is used to generate dwell times for the vector scanned pixel address scheme of a focused ionbeam deflection system, incorporating the absolute sputter yield of the solid as a function of the angle of incidence, and the relationship between the ionbeam current distribution and the pixel size of the deflection pattern.