D
Desalegne Teweldebrhan
Researcher at University of California, Riverside
Publications - 48
Citations - 16805
Desalegne Teweldebrhan is an academic researcher from University of California, Riverside. The author has contributed to research in topics: Graphene & Topological insulator. The author has an hindex of 26, co-authored 48 publications receiving 15000 citations. Previous affiliations of Desalegne Teweldebrhan include University of California.
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Crystal Symmetry Breaking in Few-Quintuple Bismuth Telluride Films: Applications in Nanometrology of Topological Insulators
TL;DR: In this article, the authors reported results of micro-Raman spectroscopy investigation of the "graphene-like" mechanically exfoliated single-crystal bismuth telluride films with the thickness ranging from a few-nm to bulk limit.
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Crystal symmetry breaking in few-quintuple Bi2Te3 films: Applications in nanometrology of topological insulators
TL;DR: In this paper, the authors reported results of micro-Raman spectroscopy investigation of mechanically exfoliated single-crystal bismuth telluride films with thickness ranging from a few-nanometers to bulk limit.
Journal ArticleDOI
Mechanically-Exfoliated Stacks of Thin Films of Bi2Te3 Topological Insulators with Enhanced Thermoelectric Performance
TL;DR: In this article, the authors report on a graphene-like mechanical exfoliation of single-crystal Bi2Te3 films and thermoelectric characterization of the stacks of such films.
Journal ArticleDOI
Mechanically-Exfoliated Stacks of Thin Films of Bismuth Telluride Topological Insulators with Enhanced Thermoelectric Performance
TL;DR: In this paper, the authors report on "graphene-like" mechanical exfoliation of single-crystal Bi2Te3 films and thermoelectric characterization of the stacks of such films.
Journal ArticleDOI
Atomically-thin crystalline films and ribbons of bismuth telluride
TL;DR: In this paper, a graphene-like exfoliation of the large-area crystalline films and ribbons of bismuth telluride with the thickness of a few atoms is described.