E
Edson R. Leite
Researcher at Federal University of São Carlos
Publications - 548
Citations - 16546
Edson R. Leite is an academic researcher from Federal University of São Carlos. The author has contributed to research in topics: Thin film & Photoluminescence. The author has an hindex of 63, co-authored 535 publications receiving 15303 citations. Previous affiliations of Edson R. Leite include Sao Paulo State University & Centro Federal de Educação Tecnológica de Minas Gerais.
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In2O3 microcrystals obtained from rapid calcination in domestic microwave oven
TL;DR: In this article, a simple way to prepare In2O3 microcrystals was reported using the microwave assisted hydthermal (MAH) method, and the precursor, In(OH)3 microstructures, were obtained using the Microwave-Assisted Hydrothermal Method.
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Influence of processing conditions on the crystal structure and magnetic behavior of La0.7Ca0.3MnO3±δ samples
TL;DR: In this paper, the authors report crystallographic structure variations and the related modifications on the magnetic behavior of La 0.7 Ca 0.3 MnO 3± δ introduced by heat-treatments in different synthesis atmospheric conditions.
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Combined wet-chemical process to synthesize 65PMN-35PT nanosized powders
TL;DR: In this article, it was shown that pure 65PMN-35PT powders can be obtained by the columbite method with the use of the partial oxalate and oxidant peroxo methods.
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Direct Amorphous‐to‐Cubic Perovskite Phase Transformation for Lead Titanate
TL;DR: In this paper, the phase evolution of lead titanate processed by the polymeric precursor method was investigated by thermal analysis, X-ray diffraction, and high-resolution transmission electron microscopy.
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Structural phase evolution of strontium-doped lead titanate thin films prepared by the soft chemical technique
F. M. Pontes,S. H. Leal,Paulo S. Pizani,M. R. M. C. Santos,Edson R. Leite,Elson Longo,F. Lanciotti,T. M. Boschi,José Arana Varela +8 more
TL;DR: In this paper, the structural phase evolution as a function of the Sr contents was studied using micro-Raman scattering, specular reflectance infrared Fourier transform spectroscopy, and x-ray diffraction.