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Eduard Arzt

Researcher at Saarland University

Publications -  435
Citations -  24492

Eduard Arzt is an academic researcher from Saarland University. The author has contributed to research in topics: Dislocation & Thin film. The author has an hindex of 76, co-authored 425 publications receiving 22528 citations. Previous affiliations of Eduard Arzt include University of Nebraska–Lincoln & Leibniz Institute for Neurobiology.

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Proceedings ArticleDOI

Temperature dependence of the resistivity of individual multi-walled pure/boron doped carbon nanotubes at elevated temperatures

TL;DR: In this article, the resistivities of individual multi-walled pure/boron doped carbon nanotubes have been measured in the temperature range from 25 to 300 ˚C. The connection patterns were formed by depositing two-terminal tungsten wires on a nanotube using focused-ion-beam lithography.
Journal ArticleDOI

Response to comment on: Size effects on yield strength and strain hardening for ultra-thin Cu films with and without passivation: A study by synchrotron and bulge test techniques

TL;DR: In this paper, the deformation behavior of ultrathin Cu and Ta/Cu film systems on polyimide substrates has been analyzed and new results obtained by peak profile analysis of the original in situ diffraction data are presented.
Journal ArticleDOI

A Model for the Increased Elastic Compliance in Human Cancer Cells

TL;DR: In this paper, the change in the keratin network was modeled and the model structures were computationally deformed using a Finite Element Method, showing a marked difference in the mechanical behavior of the cells for tensile and compressive loading conditions.
Journal ArticleDOI

The Role of Chemical Composition for the Ductility and Microstructure of Thin NiAl Films

TL;DR: In this article, NiAl films with compositions between 45.0 and 51.5 at-% Al and a thickness of 1.2 μm were studied and the residual stresses in the Ni-rich and stoichiometric films after annealing were found to be independent of composition, while the Al-rich films showed a significant decrease in film stress.