E
Eduard Arzt
Researcher at Saarland University
Publications - 435
Citations - 24492
Eduard Arzt is an academic researcher from Saarland University. The author has contributed to research in topics: Dislocation & Thin film. The author has an hindex of 76, co-authored 425 publications receiving 22528 citations. Previous affiliations of Eduard Arzt include University of Nebraska–Lincoln & Leibniz Institute for Neurobiology.
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Journal ArticleDOI
Biological and artificial attachment devices: Lessons for materials scientists from flies and geckos
Eduard Arzt,Eduard Arzt +1 more
TL;DR: In this paper, the structure, size and shape of the contact elements are investigated and the principle of "contact splitting" is identified: finer contact elements produce larger contact forces in heavier animals.
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In situ transmission electron microscopy study of dislocations in a polycrystalline Cu thin film constrained by a substrate
TL;DR: In this paper, a thin Cu film on a SiNx/SiOx coated silicon wafer was observed by transmission electron microscopy (TEM) during thermal cycling of a cross-sectional specimen.
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Adhesion design maps for fibrillar adhesives: the effect of shape.
TL;DR: Design and materials selection charts to determine the optimum materials and design combination for dry adhesive systems have been established and the effect of shape on the adhesive properties of single fibers and fiber arrays has also been a research focus.
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Microstructural evolution in passivated Al films on Si substrates during thermal cycling
Marc Legros,Kevin J. Hemker,A. Gouldstone,Subra Suresh,R.-M. Keller-Flaig,Eduard Arzt,Eduard Arzt +6 more
TL;DR: In situ and post-mortem transmission electron microscopy (TEM) observations of thermally cycled Al thin films have been made to identify and characterize the deformation mechanisms that govern the thermo-mechanical response of these films.
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Abnormal growth of giant grains in silver thin films
TL;DR: In this article, the microstructure and texture of as-deposited and annealed films have been characterized using X-ray, electron backscatter diffraction (EBSD) and focused ion beam (FIB) techniques.