F
Farhan Rasheed
Researcher at Karlsruhe Institute of Technology
Publications - 10
Citations - 101
Farhan Rasheed is an academic researcher from Karlsruhe Institute of Technology. The author has contributed to research in topics: Transistor & Printed electronics. The author has an hindex of 4, co-authored 10 publications receiving 77 citations.
Papers
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Journal ArticleDOI
A Smooth EKV-Based DC Model for Accurate Simulation of Printed Transistors and Their Process Variations
Farhan Rasheed,Mohammad Saber Golanbari,Gabriel Cadilha Marques,Mehdi B. Tahoori,Jasmin Aghassi-Hagmann +4 more
TL;DR: In this article, an empirical dc model for printed electrolyte-gated field effect transistors (EGFETs) is proposed, which can describe the behavior of the EGFETs smoothly and accurately over all regimes.
Journal ArticleDOI
Variability Modeling for Printed Inorganic Electrolyte-Gated Transistors and Circuits
TL;DR: In this paper, a generic methodology for variability modeling of printed transistors, based on the Gaussian mixture model, is proposed, which can be used to model any arbitrary distribution of the transistor model parameters.
Proceedings ArticleDOI
From silicon to printed electronics: a coherent modeling and design flow approach based on printed electrolyte gated FETs
TL;DR: It is shown how the measurements performed in the lab can accurately be modeled in order to be integrated in the design automation tool flow in the form of a Process Design Kit (PDK).
Proceedings ArticleDOI
Printed microprocessors
Nathaniel Bleier,Muhammad Husnain Mubarik,Farhan Rasheed,Jasmin Aghassi-Hagmann,Mehdi B. Tahoori,Rakesh Kumar +5 more
TL;DR: This paper performs a design space exploration of printed microprocessor architectures over multiple parameters - datawidths, pipeline depth, etc, and shows that the best cores outperform pre-existing cores by at least one order of magnitude in terms of power and area.
Proceedings ArticleDOI
Predictive Modeling and Design Automation of Inorganic Printed Electronics
Farhan Rasheed,Michael Hefenbrock,Rajendra Bishnoi,Michael BeigI,Jasmin Aghassi-Hagmann,Mehdi B. Tahoori +5 more
TL;DR: A modeling approach to describe the variations of printed devices and a reliability-aware routing solution for printed electronics technology based on the technology constraints in printing crossovers are discussed.