F
Flavio Soldera
Researcher at Saarland University
Publications - 112
Citations - 1730
Flavio Soldera is an academic researcher from Saarland University. The author has contributed to research in topics: Focused ion beam & Thin film. The author has an hindex of 20, co-authored 111 publications receiving 1304 citations. Previous affiliations of Flavio Soldera include Centre national de la recherche scientifique.
Papers
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Electronic structures of Cu2O, Cu4O3, and CuO: A joint experimental and theoretical study
Y. Wang,Stephan Lany,Jaafar Ghanbaja,Yannick Fagot-Revurat,Yuanping Chen,Flavio Soldera,David Horwat,F. Mücklich,Jean-François Pierson +8 more
TL;DR: In this paper, a joint experimental and theoretical study for the electronic structures of copper oxides including CuO, and the metastable mixed-valence oxide (MVO) was presented.
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Quantification of hydrothermal degradation in zirconia by nanoindentation
TL;DR: In this article, a study by nanoindentation of the hydrothermal degradation of tetragonal zirconia polycrystals doped with yttria with a size of 0.3μm was presented.
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Electrochemical behavior of nanocrystalline Ta/TaN multilayer on 316L stainless steel: Novel bipolar plates for proton exchange membrane fuel-cells
Mostafa Alishahi,Farzad Mahboubi,S.M. Mousavi Khoie,Mario Aparicio,René Hübner,Flavio Soldera,Raúl Gago +6 more
TL;DR: In this paper, the use of nanocrystalline Ta/TaN multilayer coatings to improve the electrical and electrochemical performance of polished 316L SS bipolar plates was explored.
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In-situ synchrotron radiation study of the aging response of Ti-6Al-4V alloy with different starting microstructures
Bruna Callegari,Bruna Callegari,João Pedro Oliveira,Katherine Aristizabal,Rodrigo Santiago Coelho,Pedro Paiva Brito,L. Wu,N. Schell,Flavio Soldera,F. Mücklich,Haroldo Cavalcanti Pinto +10 more
TL;DR: The aging behavior of a Ti-6Al-4V alloy with different starting microstructures was evaluated by means of synchrotron X-ray diffraction, scanning-transmission electron microscopy and micro-hardness measurements as discussed by the authors.
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Tuning the structure and preferred orientation in reactively sputtered copper oxide thin films
Y. Wang,Jaafar Ghanbaja,Flavio Soldera,Sylvie Migot,Pascal Boulet,David Horwat,F. Mücklich,Jean-François Pierson +7 more
TL;DR: In this paper, the influence of oxygen flow rate and total pressure on the film structure and its preferred orientation has been studied by combining X-ray diffraction and Raman spectrometry.