Gian Carlo Gazzadi

TL;DR: In this paper, focused electron beam-induced deposition (FEBID) of cobalt tricarbonyl nitrosyl (Co(CO)3NO) precursor has been thoroughly characterized from an electrical, magnetic, and structural point of view.

TL;DR: In this paper, an electrostatic sorter was used to analyze the orbital angular momentum (OAM) states of electron beams in a transmission electron microscope, achieving an OAM resolution of 50 nm.

TL;DR: Si(3)N(4) cantilevers have been endowed with a nano-electrode at the tip apex to confine the electro-sensitive area at the very tip to results in both a marked decrease of the parasitic capacitive effect and in an improved electric force microscopy (EFM) contrast and resolution.

TL;DR: In this article, a focused ion beam (FIB)-scanning electron microscope (SEM) workstation was used to grow free-standing nanoelectrodes by SEM-assisted Pt deposition between FIB-patterned Au pads.