Showing papers by "Giorgio Fallica published in 2003"
TL;DR: In this paper, the design and fabrication of a single photon avalanche detector (SPAD) in planar technology is discussed, and experimental test procedures are described for dark counting rate, afterpulsing probability, photon timing resolution, and quantum detection efficiency.
Abstract: Design and fabrication of single photon avalanche detector (SPAD) in planar technology is reported. Device design and critical issues in the technology are discussed. Experimental test procedures are described for dark-counting rate, afterpulsing probability, photon timing resolution, and quantum detection efficiency. Low-noise detectors are obtained, with dark counting rates down to 10 c/s for devices with 10 /spl mu/m diameter, down to 1 kc/s for 50 /spl mu/m diameter. The technology is suitable for monolithic integration of SPAD detectors and associated circuits.
107 citations
01 Jan 2003
TL;DR: In this paper, a thorough noise characterization, including series and parallel contribution measurements, was performed in view of the design of high-speed analog front-end electronics for radiation detectors, and a method for optimizing the noise performances of charge measuring systems has been applied to the experimental data from single device characterization.
Abstract: This paper is concerned with the analysis of the noise properties of NPN bipolar junction transistors fabricated in a monolithic technology. Such devices are part of a BiCMOS silicon on insulator process, whose suitability for radiation hard applications is being evaluated. A thorough noise characterization, including series and parallel contribution measurements, was performed in view of the design of high-speed analog front-end electronics for radiation detectors. For this purpose, a method for optimizing the noise performances of charge measuring systems has been applied to the experimental data from single device characterization.
5 citations
TL;DR: In this article, the design and fabrication of a single photon avalanche detector (SPAD) in planar technology is discussed, and experimental test procedures are described for dark counting rate, afterpulsing probability, photon timing resolution, and quantum detection efficiency.
Abstract: Design and fabrication of single photon avalanche detector (SPAD) in planar technology is reported. Device design and critical issues in the technology are discussed. Experimental test procedures are described for dark-counting rate, afterpulsing probability, photon timing resolution, and quantum detection efficiency. Low-noise detectors are obtained, with dark counting rates down to 10 c/s for devices with 10 m diameter, down to 1 kc/s for 50 m diameter. The technology is suitable for monolithic integration of SPAD detectors and associated circuits.
1 citations