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Giwoong Nam

Researcher at Inje University

Publications -  74
Citations -  634

Giwoong Nam is an academic researcher from Inje University. The author has contributed to research in topics: Thin film & Photoluminescence. The author has an hindex of 13, co-authored 74 publications receiving 593 citations.

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Effects of Doping with Al, Ga, and In on Structural and Optical Properties of ZnO Nanorods Grown by Hydrothermal Method

TL;DR: In this paper, the structural and optical properties of the ZnO, Al-doped, Ga-Doped, and In-dope ZnOs were investigated using field-emission scanning electron microscopy, X-ray diffraction, photoluminescence (PL) and ultraviolet-visible spectroscopy.
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Structural and blue emission properties of Al-doped ZnO nanorod array thin films grown by hydrothermal method

TL;DR: The structural and blue emission properties of the ZnO and AZO nanorod array thin films were investigated using scanning electron microscopy (SEM), x-ray diffraction, Ultraviolet-visible spectroscopy, and photoluminescence (PL) as mentioned in this paper.
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Growth and Characterization of Indium-Doped Zinc Oxide Thin Films Prepared by Sol-Gel Method

TL;DR: In this paper, the optical band gap of the indium-doped ZnO thin films were changed with In content and the Urbach energy was changed inversely with optical band gaps.
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Thickness Dependence of Properties of ZnO Thin Films on Porous Silicon Grown by Plasma-assisted Molecular Beam Epitaxy

TL;DR: In this paper, the effects of the thickness and porous silicon on the properties of the ZnO thin films were investigated by scanning electron microscopy (SEM), X-ray diffraction (XRD), and photoluminescence (PL).
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White light emission from nano-fibrous ZnO thin films/porous silicon nanocomposite

TL;DR: In this paper, nano-fibrous ZnO thin films and porous silicon (PS) were prepared and examined by atomic force microscopy (AFM), X-ray diffraction (XRD), Raman spectroscopy, and photoluminescence (PL) to investigate their structural and optical properties.