G
Giwoong Nam
Researcher at Inje University
Publications - 74
Citations - 634
Giwoong Nam is an academic researcher from Inje University. The author has contributed to research in topics: Thin film & Photoluminescence. The author has an hindex of 13, co-authored 74 publications receiving 593 citations.
Papers
More filters
Journal ArticleDOI
Effects of Doping with Al, Ga, and In on Structural and Optical Properties of ZnO Nanorods Grown by Hydrothermal Method
Soaram Kim,Giwoong Nam,Hyunggil Park,Hyun Sik Yoon,Sang-heon Lee,Jong Su Kim,Jin-Soo Kim,Do Yeob Kim,Sung-O Kim,Jae-Young Leem +9 more
TL;DR: In this paper, the structural and optical properties of the ZnO, Al-doped, Ga-Doped, and In-dope ZnOs were investigated using field-emission scanning electron microscopy, X-ray diffraction, photoluminescence (PL) and ultraviolet-visible spectroscopy.
Journal ArticleDOI
Structural and blue emission properties of Al-doped ZnO nanorod array thin films grown by hydrothermal method
TL;DR: The structural and blue emission properties of the ZnO and AZO nanorod array thin films were investigated using scanning electron microscopy (SEM), x-ray diffraction, Ultraviolet-visible spectroscopy, and photoluminescence (PL) as mentioned in this paper.
Journal ArticleDOI
Growth and Characterization of Indium-Doped Zinc Oxide Thin Films Prepared by Sol-Gel Method
Myung-Kyun Kim,Kwang-Gug Yim,Soaram Kim,Giwoong Nam,Dong-hwal Lee,Jin-Soo Kim,Jong Su Kim,Jae-Young Leem +7 more
TL;DR: In this paper, the optical band gap of the indium-doped ZnO thin films were changed with In content and the Urbach energy was changed inversely with optical band gaps.
Journal ArticleDOI
Thickness Dependence of Properties of ZnO Thin Films on Porous Silicon Grown by Plasma-assisted Molecular Beam Epitaxy
Min Su Kim,Kwang Gug Yim,Jae-Young Leem,Soaram Kim,Giwoong Nam,Dong-Yul Lee,Jin-Soo Kim,Jong Su Kim +7 more
TL;DR: In this paper, the effects of the thickness and porous silicon on the properties of the ZnO thin films were investigated by scanning electron microscopy (SEM), X-ray diffraction (XRD), and photoluminescence (PL).
Journal ArticleDOI
White light emission from nano-fibrous ZnO thin films/porous silicon nanocomposite
TL;DR: In this paper, nano-fibrous ZnO thin films and porous silicon (PS) were prepared and examined by atomic force microscopy (AFM), X-ray diffraction (XRD), Raman spectroscopy, and photoluminescence (PL) to investigate their structural and optical properties.