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Han S. Uhm

Researcher at Kwangwoon University

Publications -  102
Citations -  1308

Han S. Uhm is an academic researcher from Kwangwoon University. The author has contributed to research in topics: Plasma & Xenon. The author has an hindex of 19, co-authored 101 publications receiving 1156 citations. Previous affiliations of Han S. Uhm include Naval Surface Warfare Center & Ajou University.

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Influence of reactive species on the modification of biomolecules generated from the soft plasma

TL;DR: The soft plasma used in this work has revealed that H2O2 molecules preferably attack the amino acids near heme group, and N2 gas plasma has strong deformation action on biomolecules and compared to other gases plasma.
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Influence of the gas-flow Reynolds number on a plasma column in a glass tube

TL;DR: In this paper, the authors show that the length of the plasma column is short in front of the electrode, eventually leading to a shutdown, and that the column length increases with an increase in the gas flow rate under laminar flow characterized by Reynolds number.
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Disintegration of Carbon Dioxide Molecules in a Microwave Plasma Torch.

TL;DR: Analysis of carbon dioxide disintegration and gas temperature effects on the molecular fraction characteristics in the carbon dioxide plasma of a microwave plasma torch under atmospheric pressure indicates that substantial fraction ofcarbon dioxide molecules disintegrate and form other compounds in the torch.
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Influence of secondary electron emission on breakdown voltage in a plasma display panel

TL;DR: A measurement of the secondary electron emission coefficient from MgO film in a plasma display panel is carried out by making use of the Townsend sparking criterion as discussed by the authors, verifying the previous theoretical model.
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Striations in a coplanar ac-plasma display panel

TL;DR: In this paper, the authors observed that the striations are related to ion charge waves of the wall generated by the self-sustained perturbations that originate from the force balance between the ion and the electron wall-charge clouds accumulated on the dielectric layers over the metal electrodes.