H
Hao Zhang
Researcher at University of Arkansas
Publications - 8
Citations - 42
Hao Zhang is an academic researcher from University of Arkansas. The author has contributed to research in topics: Power module & Electrical element. The author has an hindex of 4, co-authored 8 publications receiving 38 citations.
Papers
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Proceedings ArticleDOI
A 6.5kV wire-bondless, double-sided cooling power electronic module
TL;DR: In this article, a 6.5kV wire-bondless power electronics module with double-sided cooling is proposed and evaluated, where a direct solder attachment is employed to minimize parasitic circuit elements and increase current handling capability as well as to enable a doublesided cooling capability with mechanical robustness.
Proceedings ArticleDOI
A silicon carbide fault current limiter for distribution systems
Yusi Liu,Chris Farnell,Hao Zhang,Andres Escobar-Mejia,H. Alan Mantooth,Juan Carlos Balda,Simon S. Ang +6 more
TL;DR: In this article, a series-connected solid-state fault current limiter (SSFCL) is proposed to isolate very fast faulted sections of a distribution system by using super gate turnoff thyristors and PINs.
Journal ArticleDOI
Thermo-mechanical Simulations for Single-Sided and Double-Sided Cooling Power Packages
Hao Zhang,Simon S. Ang +1 more
TL;DR: In this article, the authors compare single-sided and double-sided cooling power packaging structures to elucidate advantages and disadvantages of these packaging structures in terms of thermal and thermo-mechanical based on finite element simulations.
Proceedings ArticleDOI
A sic SGTO/PIN diode power electronic module for a fault current limiter
TL;DR: The design and fabrication of power modules based on SiC diode and super gate turn-off thyristor for use in a solid-state fault current limiter (SSFCL) for 4.16 kV distribution systems are documents.
Proceedings ArticleDOI
High temperature power electronic module packaging
Simon S. Ang,Hao Zhang +1 more
TL;DR: In this article, the material and fabrication issues and technologies for high temperature packaging for wide band-gap semiconductor devices are discussed, and the authors discuss the advantages of using wide band gap semiconductors in high temperature applications.