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He Ding

Researcher at Shanghai University

Publications -  8
Citations -  114

He Ding is an academic researcher from Shanghai University. The author has contributed to research in topics: Atomic layer deposition & Thin-film transistor. The author has an hindex of 7, co-authored 8 publications receiving 99 citations.

Papers
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Thin film encapsulation for organic light-emitting diodes using inorganic/organic hybrid layers by atomic layer deposition.

TL;DR: It is found that moisture barrier performance was improved with the increasing of the number of dyads (Al2O3/ZrO2/alucone) and the WVTR reached 8.5 × 10−5 g/m2/day at 25°C, relative humidity (RH) 85%.
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Growth of IZO/IGZO dual-active-layer for low-voltage-drive and high-mobility thin film transistors based on an ALD grown Al2O3 gate insulator

TL;DR: In this article, the authors integrated the high-performance oxide thin film transistors with novel IZO/IGZO dual-active layer TFTs, which exhibited the excellent performances; specifically, a high field effect mobility of 14.4 cm2/Vs, a suitable threshold voltage of 0.8 ǫV, high on/off ratio of more than 107, a steep sub-threshold swing of 0.13 V/dec, and a substantially small threshold voltage shift.
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ZrO2 insulator modified by a thin Al2O3 film to enhance the performance of InGaZnO thin-film transistor

TL;DR: The performance enhancements are attributed to the suppression of leakage current, smoother surface morphology, and suppression of charge trapping by using Al 2 O 3 films to modify the high- k ZrO 2 dielectric.
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Sunlight-like white organic light-emitting diodes with inorganic/organic nanolaminate distributed Bragg reflector (DBR) anode microcavity by using atomic layer deposition

TL;DR: In this paper, the inorganic/organic/hybrid nanolaminate distributed Bragg reflector (DBR) was used to achieve a sunlight-like WOLED.
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Effect of gate insulator thickness on device performance of InGaZnO thin-film transistors

TL;DR: In this paper, the effect of Al2O3 thickness on the performance of top-contact thin-film transistors (TFTs) was investigated using atomic layer deposition (ALD) Al 2O3 as the gate insulator and radio frequency sputtering InGaZnO (IGZO) as the channel layer.