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Heather Quinn

Researcher at Los Alamos National Laboratory

Publications -  82
Citations -  2026

Heather Quinn is an academic researcher from Los Alamos National Laboratory. The author has contributed to research in topics: Field-programmable gate array & Fault injection. The author has an hindex of 24, co-authored 76 publications receiving 1660 citations. Previous affiliations of Heather Quinn include Northeastern University.

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Radiation-induced multi-bit upsets in SRAM-based FPGAs

TL;DR: In this article, a methodology for estimating the proton and heavy ion static saturation cross-sections for multi-bit upsets in Xilinx field-programmable gate arrays is presented.
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SRAM FPGA Reliability Analysis for Harsh Radiation Environments

TL;DR: In this paper, a reliability model for estimating the composite mean time to failure (MTTF) of SRAM FPGA designs in specific orbits and orbit conditions is presented, which requires orbit-and condition-specific SEU rates and design-specific estimates of the probability of failure during a single scrubbing period.
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The SuperCam Instrument Suite on the NASA Mars 2020 Rover: Body Unit and Combined System Tests

Roger C. Wiens, +131 more
TL;DR: The SuperCam body unit (BU) of the Mars 2020 rover as mentioned in this paper was designed to receive light from the mast unit via a 5.8 m opti-cal fiber and the light is split into three wavelength bands by a demultiplexer, and routed via fiber bundles to three optical spectrometers, two of which (UV and violet; 245-340 and 385-465 nm) are crossed Czerny-Turner reflection spectrometer, nearly identical to their counterparts on ChemCam.
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Domain Crossing Errors: Limitations on Single Device Triple-Modular Redundancy Circuits in Xilinx FPGAs

TL;DR: From this study, it is found that the configurable logic block's routing network is vulnerable to domain crossing errors, or TMR defeats, by even 2-bit multiple-bit upsets.
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Fault Simulation and Emulation Tools to Augment Radiation-Hardness Assurance Testing

TL;DR: Fault injection tools, which include both fault simulation and emulation tools, have become more common in the last 15 years as discussed by the authors, which can provide the designers the luxury of testing on the benchtop without the time and financial constraints of accelerated radiation testing.