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Hervé Rigneault

Researcher at Aix-Marseille University

Publications -  411
Citations -  12477

Hervé Rigneault is an academic researcher from Aix-Marseille University. The author has contributed to research in topics: Raman scattering & Raman spectroscopy. The author has an hindex of 50, co-authored 378 publications receiving 11005 citations. Previous affiliations of Hervé Rigneault include Centre national de la recherche scientifique & Université Paul Cézanne Aix-Marseille III.

Papers
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Proceedings ArticleDOI

Mechanical properties of dielectric thin films

TL;DR: In this paper, a multilayer stack composed of tantalum pentoxide and silicon dioxide layers is considered and the interactions layer to layer turn out to have no effect as regards to the final bending.
Book ChapterDOI

Dielectric Thin Films for Microcavity Applications

TL;DR: The considerable development of optical instruments leads, in turn, to various studies on interference thin films in order to master the manufacturing of surface coatings with prescribed optical properties as, for example, antireflection filters, laser cavity mirrors, narrow band filters, and so on.
Journal ArticleDOI

Polarized Resolved Single-Molecule Localization-Based Super-Resolution Fluorescence Microscopy Reveals Orientation Order in Bio-Molecular Assemblies

TL;DR: A super-resolution polarization-resolved microscopy technique able to image molecular orientation in static and dynamic environments at single molecule level and nano-scale resolution is reported, based on a refined signal analysis technique which provides high accuracy in the estimation of molecular anisotropies.
Proceedings ArticleDOI

Solid-Core Photonic Bandgap Fiber for the Generation of Tunable High-Energy Solitons

TL;DR: In this paper, the authors demonstrate the design and use of specialty solid-core photonic bandgap fibers for the generation and delivery of short solitons tunable over 2500 cm-1 with an energy up to 700 pJ.
Patent

Device and method for measuring a sample by correlation spectroscopy

TL;DR: In this paper, a device and a method for measuring a sample by correlation spectroscopy using a confocal microscope and a focusing optical system is described. But it is not shown how to detect the intensity of the light flux produced by the interaction of the excitation beam on the sample and collected by the microscope.